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Yang Huang 0002

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affiliation: Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China

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2010 – 2019

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2018
[j2]
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  - journals/mr/LiHWHLZYWLHY18
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  - https://dblp.org/rec/journals/mr/LiHWHLZYWLHY18
Binhong Li, Yang Huang, Jianfei Wu, Yunbo Huang, Bo Li, Qingzhu Zhang, Ling Yang, Fayu Wan, Jiajun Luo, Zhengsheng Han, Huaxiang Yin:
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment. Microelectron. Reliab. 88-90: 969-973 (2018)
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Jian Wang, Binhong Li, Yang Huang, Kai Zhao, Fang Yu, Qiwen Zheng, Qi Guo, Liewei Xu, J. Gao, X. Cai, Y. Cui:
The total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectron. Reliab. 88-90: 979-983 (2018)

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