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"Design for Diagnosability of CMOS Circuits."
Xiaoqing Wen et al. (1998)
- Xiaoqing Wen, Tooru Honzawa, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita:
Design for Diagnosability of CMOS Circuits. Asian Test Symposium 1998: 144-149
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