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"An edge-from-focus approach to 3D inspection and metrology."

Fuqin Deng et al. (2015)

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DOI: 10.1117/12.2074757

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-06

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  - conf/ei-ipmva/DengCL0DFL15
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  - https://dblp.org/rec/conf/ei-ipmva/DengCL0DFL15
Fuqin Deng, Jia Chen, Jianyang Liu, Zhijun Zhang, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam:
An edge-from-focus approach to 3D inspection and metrology. Image Processing: Machine Vision Applications 2015: 94050E

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