"Reliability enhancement of embedded memory with combination of aging-aware ..."

Gian Mayuga et al. (2016)

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DOI: 10.1109/ETS.2016.7519284

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue:
Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. ETS 2016: 1-2

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