"Similarity-based Local Feature Extraction for Wafer Bin Map Pattern ..."

Jieun Kim, Jun-Geol Baek (2022)

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DOI: 10.1109/ICAIIC54071.2022.9722665

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Jieun Kim, Jun-Geol Baek:
Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition. ICAIIC 2022: 56-59

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