"Model-based Testing and Monitoring for Hybrid Embedded Systems."

Li Tan et al. (2004)

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DOI: 10.1109/IRI.2004.1431508

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-26

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Li Tan, Jesung Kim, Oleg Sokolsky, Insup Lee:
Model-based Testing and Monitoring for Hybrid Embedded Systems. IRI 2004: 487-492

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