"Product Lifetime Estimation in 7nm with Large data of Failure Rate and ..."

Jae-Gyung Ahn et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405193

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Jae-Gyung Ahn, Rhesa Nathanael, I-Ru Chen, Ping-Chin Yeh, Jonathan Chang:
Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model. IRPS 2021: 1-6

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