"Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted ..."

Vamsi Putcha et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129251

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Vamsi Putcha, Erik Bury, Jacopo Franco, Amey Walke, Simeng Zhao, Uthayasankaran Peralagu, Ming Zhao, AliReza Alian, Ben Kaczer, Niamh Waldron, Dimitri Linten, Bertrand Parvais, Nadine Collaert:
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications. IRPS 2020: 1-8

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