"Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET."

Xinyi Zhang et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117718

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Xinyi Zhang, Kewei Wang, Fang Wang, Jiangjiang Li, Zhicheng Wu, Duoli Li, Bo Li, Jianhui Bu, Zhengsheng Han:
Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET. IRPS 2023: 1-5

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