"A body-biasing of readout circuit for STT-RAM with improved thermal ..."

Lun Yang et al. (2015)

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DOI: 10.1109/ISCAS.2015.7168937

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-19

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Lun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, Aida Todri-Sanial:
A body-biasing of readout circuit for STT-RAM with improved thermal reliability. ISCAS 2015: 1530-1533

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