"Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits."

Elena Dubrova, Dilian Gurov, Jon C. Muzio (1994)

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DOI: 10.1109/ISMVL.1994.302189

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Elena Dubrova, Dilian Gurov, Jon C. Muzio:
Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits. ISMVL 1994: 284-288

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