"Sensitivity of reliability growth models to operational profile errors."

Adalberto Nobiato Crespo, Paolo Matrella, Alberto Pasquini (1996)

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DOI: 10.1109/ISSRE.1996.558688

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Adalberto Nobiato Crespo, Paolo Matrella, Alberto Pasquini:
Sensitivity of reliability growth models to operational profile errors. ISSRE 1996: 35-44

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