"On Testing of Interconnect Open Defects in Combinational Logic Circuits ..."

Sudhakar M. Reddy et al. (2002)

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DOI: 10.1109/TEST.2002.1041748

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita:
On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. ITC 2002: 83-89

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