"Code-Density Test of Analog-to-Digital Converters Using Single ..."

Le Jin, Degang Chen, Randall L. Geiger (2007)

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DOI: 10.1109/VTS.2007.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310

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