"Review of Manufacturing Process Defects and Their Effects on Memristive ..."

Letícia Maria Veiras Bolzani et al. (2021)

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DOI: 10.1007/S10836-021-05968-8

access: closed

type: Journal Article

metadata version: 2023-03-21

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Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke:
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electron. Test. 37(4): 427-437 (2021)

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