"Research on single-event transient mechanism in a novel SOI CMOS technology."

Chao Zhang et al. (2014)

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DOI: 10.1587/ELEX.11.20140518

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/ZhangCCY14
Chao Zhang, Jianjun Chen, Yaqing Chi, Hui Yang:
Research on single-event transient mechanism in a novel SOI CMOS technology. IEICE Electron. Express 11(18): 20140518 (2014)

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