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"Cost-Sensitive and Sparse Ladder Network for Software Defect Prediction."

Jing Sun et al. (2020)

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DOI: 10.1587/TRANSINF.2019EDL8198

access: closed

type: Journal Article

metadata version: 2021-01-18

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  dblp key:
  - journals/ieicetd/SunJLW20
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  persistent URL:
  - https://dblp.org/rec/journals/ieicetd/SunJLW20
Jing Sun, Yi-mu Ji, Shangdong Liu, Fei Wu:
Cost-Sensitive and Sparse Ladder Network for Software Defect Prediction. IEICE Trans. Inf. Syst. 103-D(5): 1177-1180 (2020)

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