"Extraction and Simulation of Intra-gate Defects Affecting CMOS Libraries."

Aymen Ladhar, Mohamed Masmoudi (2010)

> Home

Details and statistics

DOI: 10.4304/JCP.5.10.1468-1477

access: open

type: Journal Article

metadata version: 2021-02-25

- view
  - electronic edition @ jcomputers.us (open access)
  - electronic edition via DOI (archived)
  authority control:
- export record
  dblp key:
  - journals/jcp/LadharM10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcp/LadharM10
Aymen Ladhar, Mohamed Masmoudi:
Extraction and Simulation of Intra-gate Defects Affecting CMOS Libraries. J. Comput. 5(10): 1468-1477 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.