"Comparison of transient and static test methods for chip-to-sink thermal ..."

Brian Smith, Thomas Brunschwiler, Bruno Michel (2009)

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DOI: 10.1016/J.MEJO.2008.06.079

access: closed

type: Journal Article

metadata version: 2020-02-22

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Brian Smith, Thomas Brunschwiler, Bruno Michel:
Comparison of transient and static test methods for chip-to-sink thermal interface characterization. Microelectron. J. 40(9): 1379-1386 (2009)

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