"Modeling the impact of well contacts on SEE response with bias-dependent ..."

Lili Ding et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.11.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Lili Ding, Wei Chen, Hongxia Guo, Tan Wang, Rongmei Chen, Yinhong Luo, Fengqi Zhang, Xiaoyu Pan:
Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model. Microelectron. Reliab. 81: 337-341 (2018)

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