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"Time dependent modeling of single particle displacement damage in silicon ..."
Du Tang et al. (2016)
- Du Tang, Ignacio Martin-Bragado, Chaohui He, Hang Zang, Cen Xiong, Yonghong Li, Daxi Guo, Peng Zhang, Jinxin Zhang:
Time dependent modeling of single particle displacement damage in silicon devices. Microelectron. Reliab. 60: 25-32 (2016)
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