"Drift of MEMS Closed-Loop Accelerometers Induced by Dielectric Charging."

Jiangbo He et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TIM.2021.3099561

access: closed

type: Journal Article

metadata version: 2021-08-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/HeZHYR21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/HeZHYR21
Jiangbo He, Wu Zhou, Xiaoping He, Huijun Yu, Longqi Ran:
Drift of MEMS Closed-Loop Accelerometers Induced by Dielectric Charging. IEEE Trans. Instrum. Meas. 70: 1-7 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.