Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection."

Yunfan Ye et al. (2023)

> Home

Details and statistics

DOI: 10.1109/TIP.2023.3289296

access: closed

type: Journal Article

metadata version: 2023-11-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tip/YeYGCX23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tip/YeYGCX23
Yunfan Ye, Renjiao Yi, Zhirui Gao, Zhiping Cai, Kai Xu:
Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection. IEEE Trans. Image Process. 32: 4199-4211 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.