"Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE ..."

Yu-Jen Huang, Jin-Fu Li (2012)

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DOI: 10.1109/TVLSI.2011.2165568

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type: Journal Article

metadata version: 2023-10-17

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Yu-Jen Huang, Jin-Fu Li:
Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers. IEEE Trans. Very Large Scale Integr. Syst. 20(11): 2123-2127 (2012)

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