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- research-articleJanuary 2020
Alternate Action Recommender System Using Recurrent Patterns of Smart Home Users
2020 IEEE 17th Annual Consumer Communications & Networking Conference (CCNC)Pages 1–6https://doi.org/10.1109/CCNC46108.2020.9045128We present an alternate action recommender system for Internet of Things (IoT) smart home users. Our system takes the data of the IoT devices of the smart home users as input, applies our custom pattern-mining algorithm to derive the highly probable and ...
- opinionJanuary 2017
Editorial
- Krishnendu Chakrabarty,
- Massimo Alioto,
- Bevan M. Baas,
- Chirn Chye Boon,
- Meng-Fan Chang,
- Naehyuck Chang,
- Yao-Wen Chang,
- Chip-Hong Chang,
- Shih-Chieh Chang,
- Poki Chen,
- Masud Chowdhury,
- Pasquale Corsonello,
- Ibrahim M. Abe Elfadel,
- Said Hamdioui,
- Masanori Hashimoto,
- Tsung-Yi Ho,
- Houman Homayoun,
- Yuh-Shyan Hwang,
- Rajiv V. Joshi,
- Tanay Karnik,
- Mehran Mozaffari Kermani,
- Chulwoo Kim,
- Tae-Hyoung Kim,
- Jaydeep P. Kulkarni,
- Eren Kursun,
- Erik Larsson,
- Hai Helen Li,
- Huawei Li,
- Patrick Mercier,
- Prabhat Mishra,
- Makoto Nagata,
- Arun S. Natarajan,
- Koji Nii,
- Partha Pratim Pande,
- Ioannis Savidis,
- Mingoo Seok,
- Sheldon Tan,
- M. Tehranipoor,
- Aida Todri-Sanial,
- Miroslav N. Velev,
- Miroslav N. Velev,
- Jiang Xu,
- Wei Zhang,
- Zhengya Zhang,
- Stacey Weber Jackson
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (ITVL), Volume 25, Issue 1Pages 1–20https://doi.org/10.1109/TVLSI.2016.2638578As I start my second two-year term (2017–2018) as the Editor-in-Chief (EIC) of the IEEE Transactions on Very Large Scale Integration Systems (TVLSI), I wish the TVLSI readership a very happy new year and continued professional success. It gives me great ...
- ArticleJanuary 2013
Observability-aware Directed Test Generation for Soft Errors and Crosstalk Faults
VLSID '13: Proceedings of the 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded SystemsPages 291–296https://doi.org/10.1109/VLSID.2013.203Post-silicon validation has emerged as an important component of any chip design methodology to detect both functional and electrical errors that have escaped the pre-silicon validation phase. In order to detect these escaped errors, both ...
