research-article

Fault-tolerant multi-level logic decoder for nanoscale crossbar memory arrays

Authors:

M. Haykel Ben Jamaa,

Kirsten E. Moselund,

Adrian M. Ionescu,

Yusuf Leblebici,

Giovanni De MicheliAuthors Info & Claims

ICCAD '07: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design

Pages 765 - 772

Published: 05 November 2007 Publication History

Abstract

Several technologies with sub-lithographic features are targeting the fabrication of crossbar memories in which the nanowire decoder is playing a major role. In this paper, we suggest a way to reduce the decoder size and keep it defect tolerant by using multiple threshold voltages (V_T), which is enabled by our underlying technology. We define two types of multi-valued decoders and model the defects they undergo due to the V_T variation. Multi-valued hot decoders yield better area saving than n-ary reflexive codes (NRC), and under severe conditions, NRC enables a non-vanishing part of the code space to recover. There are many combinations of decoder type and number of V_T's yielding equal effective memory capacities. The optimal choice saves area up to 24%. We also show that the precision of the addressing voltages for decoders with unreliable V_T's is a crucial parameter for the decoder design and permits large savings in memory area.

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Cited By

Ben Jamaa MAtienza DLeblebici YDe Micheli GWakabayashi K(2009)A stochastic perturbative approach to design a defect-aware thresholder in the sense amplifier of crossbar memoriesProceedings of the 2009 Asia and South Pacific Design Automation Conference10.5555/1509633.1509819(835-840)Online publication date: 19-Jan-2009
https://dl.acm.org/doi/10.5555/1509633.1509819
Moselund KBouvet DBen Jamaa MAtienza DLeblebici YDe Micheli GIonescu A(2008)Prospects for logic-on-a-wireMicroelectronic Engineering10.1016/j.mee.2008.01.02285:5(1406-1409)Online publication date: 1-May-2008
https://dl.acm.org/doi/10.1016/j.mee.2008.01.022

Fault-tolerant multi-level logic decoder for nanoscale crossbar memory arrays
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Published In

cover image ACM Conferences

ICCAD '07: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design

November 2007

933 pages

ISBN:1424413826

General Chair:
Georges Gielen
ESAT-MICAS, Katholieke Univ. Leuven, Leuven, Belgium

Sponsors

CEDA: Council on Electronic Design Automation
SIGDA: ACM Special Interest Group on Design Automation
IEEE CASS/CANDE
IEEE-CS\DATC: IEEE Computer Society

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IEEE Press

Publication History

Published: 05 November 2007

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ICCAD07

Sponsor:

CEDA
SIGDA
IEEE-CS\DATC

ICCAD07: The International Conference on Computer-Aided Design 2007

November 5 - 8, 2007

California, San Jose

Acceptance Rates

ICCAD '07 Paper Acceptance Rate 139 of 510 submissions, 27%;

Overall Acceptance Rate 457 of 1,762 submissions, 26%

Upcoming Conference

ICCAD '24

Sponsor:
sigda

IEEE/ACM International Conference on Computer-Aided Design

October 27 - 31, 2024

New York , NY , USA

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Cited By

Ben Jamaa MAtienza DLeblebici YDe Micheli GWakabayashi K(2009)A stochastic perturbative approach to design a defect-aware thresholder in the sense amplifier of crossbar memoriesProceedings of the 2009 Asia and South Pacific Design Automation Conference10.5555/1509633.1509819(835-840)Online publication date: 19-Jan-2009
https://dl.acm.org/doi/10.5555/1509633.1509819
Moselund KBouvet DBen Jamaa MAtienza DLeblebici YDe Micheli GIonescu A(2008)Prospects for logic-on-a-wireMicroelectronic Engineering10.1016/j.mee.2008.01.02285:5(1406-1409)Online publication date: 1-May-2008
https://dl.acm.org/doi/10.1016/j.mee.2008.01.022

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