research-article

Reliability considerations in mobile devices

Authors:

I. Voyiatzis,

D. Kavvadias,

H. Antonopoulou,

S. SinitosAuthors Info & Claims

MobiMedia '07: Proceedings of the 3rd international conference on Mobile multimedia communications

Article No.: 51, Pages 1 - 5

Published: 27 August 2007 Publication History

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Abstract

The problem of reliability in current chips has been the subject of numerous researchers. Mobile devices, commonly used in multimedia communications require low power during both normal operation and testing. In this paper a novel algorithm is presented for embedding test sets containing don't care values into sequences generated by binary counters. Therefore, both test time and power consumed during testing of the chips can be considerably reduced.

References

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Reliability considerations in mobile devices

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Published In

MobiMedia '07: Proceedings of the 3rd international conference on Mobile multimedia communications

August 2007

403 pages

ISBN:9789630626705

General Chairs:
Tasos Dagiuklas,
Nicolas Sklavos

Publisher

ICST (Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering)

Brussels, Belgium

Publication History

Published: 27 August 2007

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MobiMedia07

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SIGMM

MobiMedia07: Third International Mobile Multimedia Communications Conference

August 27 - 29, 2007

Nafpaktos, Greece

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