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Test generation for multiple faults based on parallel vector pair analysis

Authors:

Seiji Kajihara,

Tetsuji Sumioka,

Kozo KinoshitaAuthors Info & Claims

ICCAD '93: Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design

Pages 436 - 439

Published: 07 November 1993 Publication History

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References

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Wang NPomeranz IReddy SSinha AVenkataraman S(2019)Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based DesignACM Transactions on Design Automation of Electronic Systems10.1145/332506624:4(1-19)Online publication date: 29-May-2019
https://dl.acm.org/doi/10.1145/3325066
Agrawal ASaldanha ALavagno LSangiovanni-Vincentelli ARutenbar ROtten R(1997)Compact and complete test set generation for multiple stuck-faultsProceedings of the 1996 IEEE/ACM international conference on Computer-aided design10.5555/244522.244559(212-219)Online publication date: 1-Jan-1997
https://dl.acm.org/doi/10.5555/244522.244559

Test generation for multiple faults based on parallel vector pair analysis
1. Hardware

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ICCAD '93: Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design

November 1993

781 pages

ISBN:0818644907

Chairmen:
Michael Lightner
Univ. of Colorado, Boulder
,
Jochen A. G. Jess
Eindhoven Univ. of Tech., Eindhoven, The Netherlands

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IEEE Computer Society Press

Washington, DC, United States

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Published: 07 November 1993

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ICCAD '93: International Conference on Computer Aided Design

November 7 - 11, 1993

California, Santa Clara, USA

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Wang NPomeranz IReddy SSinha AVenkataraman S(2019)Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based DesignACM Transactions on Design Automation of Electronic Systems10.1145/332506624:4(1-19)Online publication date: 29-May-2019
https://dl.acm.org/doi/10.1145/3325066
Agrawal ASaldanha ALavagno LSangiovanni-Vincentelli ARutenbar ROtten R(1997)Compact and complete test set generation for multiple stuck-faultsProceedings of the 1996 IEEE/ACM international conference on Computer-aided design10.5555/244522.244559(212-219)Online publication date: 1-Jan-1997
https://dl.acm.org/doi/10.5555/244522.244559

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Test Generation for Multiple State-Table Faults in Finite-State Machines

Test generation for multiple state-table faults in finite-state machines

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Test Generation for Multiple State-Table Faults in Finite-State Machines

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