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10.1109/ISQED.2007.38guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis

Published: 26 March 2007 Publication History

Abstract

Assertion Based Design, and more specifically, Assertion Based Verification (ABV) is quickly gaining wide acceptance in the design community. Assertions are mainly targeted at functional verification during the design and verification phases. In this paper, we concentrate on the use of assertions in post-fabrication silicon debug. We develop tools that efficiently generate the checkers from assertions, for their inclusion in the debug phase. We also detail how a checker generator can be used as a means of circuit design for certain portions of self test circuits, and more generally the design of monitoring circuits. Efficient subset partitioning of checkers for a dedicated fixed-size reprogrammable logic area is developed for efficient use of dedicated debug hardware.

Cited By

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  • (2018)Rapid Triggering Capability Using an Adaptive Overlay during FPGA DebugACM Transactions on Design Automation of Electronic Systems10.1145/324104523:6(1-25)Online publication date: 6-Dec-2018
  • (2017)An automated SAT-based method for the design of on-chip bit-flip detectorsProceedings of the 36th International Conference on Computer-Aided Design10.5555/3199700.3199714(101-108)Online publication date: 13-Nov-2017
  • (2015)Quick error detection tests with fast runtimes for effective post-silicon validation and debugProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757083(1168-1173)Online publication date: 9-Mar-2015
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cover image Guide Proceedings
ISQED '07: Proceedings of the 8th International Symposium on Quality Electronic Design
March 2007
921 pages
ISBN:0769527957

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IEEE Computer Society

United States

Publication History

Published: 26 March 2007

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Cited By

View all
  • (2018)Rapid Triggering Capability Using an Adaptive Overlay during FPGA DebugACM Transactions on Design Automation of Electronic Systems10.1145/324104523:6(1-25)Online publication date: 6-Dec-2018
  • (2017)An automated SAT-based method for the design of on-chip bit-flip detectorsProceedings of the 36th International Conference on Computer-Aided Design10.5555/3199700.3199714(101-108)Online publication date: 13-Nov-2017
  • (2015)Quick error detection tests with fast runtimes for effective post-silicon validation and debugProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757083(1168-1173)Online publication date: 9-Mar-2015
  • (2015)A methodology for automated design of embedded bit-flips detectors in post-silicon validationProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2755770(73-78)Online publication date: 9-Mar-2015
  • (2015)A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC RoutersProceedings of the 9th International Symposium on Networks-on-Chip10.1145/2786572.2788713(1-8)Online publication date: 28-Sep-2015
  • (2014)ForEVeRACM Transactions on Embedded Computing Systems10.1145/251487113:3s(1-30)Online publication date: 28-Mar-2014
  • (2013)Overcoming post-silicon validation challenges through quick error detection (QED)Proceedings of the Conference on Design, Automation and Test in Europe10.5555/2485288.2485367(320-325)Online publication date: 18-Mar-2013
  • (2013)Test compaction techniques for assertion-based test generationACM Transactions on Design Automation of Electronic Systems10.1145/253439719:1(1-29)Online publication date: 20-Dec-2013
  • (2013)Using implications to choose tests through suspect fault identificationACM Transactions on Design Automation of Electronic Systems10.1145/2390191.239020518:1(1-19)Online publication date: 16-Jan-2013
  • (2012)Quick detection of difficult bugs for effective post-silicon validationProceedings of the 49th Annual Design Automation Conference10.1145/2228360.2228461(561-566)Online publication date: 3-Jun-2012
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