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- Taatizadeh PNicolici NParameswaran S(2017)An automated SAT-based method for the design of on-chip bit-flip detectorsProceedings of the 36th International Conference on Computer-Aided Design10.5555/3199700.3199714(101-108)Online publication date: 13-Nov-2017
- Lin DEswaran SKumar SRentschler EMitra SNebel WAtienza D(2015)Quick error detection tests with fast runtimes for effective post-silicon validation and debugProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757083(1168-1173)Online publication date: 9-Mar-2015
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