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Cut Optimization for Redundant Via Insertion in Self-Aligned Double Patterning

Published: 09 September 2019 Publication History

Abstract

Redundant via (RV) insertion helps prevent via defects and hence leads to yield enhancement. However, RV insertion in self-aligned double patterning (SADP) processes is challenging since cut optimization has to be considered together. In SADP, parallel one-dimensional metal lines are divided into signal wires and dummy wires by line-end cuts. If an RV is inserted, signal wires need to be extended to connect to the RV. To this end, an additional cut, which we call RV cut, is introduced to make a space for the extension. Since RV cuts and line-end cuts are manufactured with the same mask set, design rules between those cuts have to be honored, which incurs proper distribution and mask assignment to individual cuts. In this article, we address a problem of integrated RV insertion and cut optimization. We show that the problem can be formulated as an integer linear programming (ILP). We also propose a heuristic algorithm is presented for practical application, in which potential locations of RVs are first identified and used to properly insert as many RVs as possible while minimizing the conflict between RV cuts. Our experimental results demonstrate that 75% of vias receive RVs with 8% increase in total wire length, which is only slightly worse than the optimal result obtained by ILP.

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  1. Cut Optimization for Redundant Via Insertion in Self-Aligned Double Patterning

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    Published In

    cover image ACM Transactions on Design Automation of Electronic Systems
    ACM Transactions on Design Automation of Electronic Systems  Volume 24, Issue 6
    November 2019
    275 pages
    ISSN:1084-4309
    EISSN:1557-7309
    DOI:10.1145/3357467
    • Editor:
    • Naehyuck Chang
    Issue’s Table of Contents
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 09 September 2019
    Accepted: 01 August 2019
    Revised: 01 June 2019
    Received: 01 December 2018
    Published in TODAES Volume 24, Issue 6

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    Author Tags

    1. Redundant via insertion
    2. cut mask optimization
    3. self-aligned double patterning

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    • World Class 300 R8D Project of MSS
    • National Research Foundation of Korea (NRF) of MSIP

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