Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
skip to main content
article

The use of triple-modular redundancy to improve computer reliability

Published: 01 April 1962 Publication History

Abstract

One of the proposed techniques for meeting the severe reliability requirements inherent in certain future computer applications is described. This technique involves the use of triple-modular redundancy, which is essentially the use of the two-out-of-three votingc oncept at a low level. Effects of imperfect voting circuitry and of various interconnections logical elements are assessed. A hypothetical triple-modular redundant computer is subjected to a Monte Carlo program on the IBM 704, which simulates component failures. Reliability is thereby determined and compared with reliability obtained by analytical calculations based on simplifying assumptions.

References

[1]
J. Von Neumann, "Probabilistic Logics," Automata Studies, Princeton University Press, 1956.
[2]
H. H. Goldstine, "Some Remarks on Logical Design and Program Checks," Proc. EJCC, Washington, D.C., Dec., 1953, pp. 96-98.
[3]
E. F. Moore and C. Shannon, "Reliable Circuits Using Less Reliable Relays," J. Franklin Inst., 262, 191-208, 281-297 (1956).
[4]
W. E. Dickinson and R. M. Walker, "Reliability Improvement by the Use of Multiple-Element Switching Circuits," IBM Journal 2, No. 2, 142 (1958).
[5]
B. J. Flehinger, "Reliability Improvement Through Redundancy at Various System Levels," IBM Journal 2, No. 2, 148 (1958).
[6]
D. E. Rosenheim and R. B. Ash, "Increasing Reliability by the Use of Redundant Machines," IRE Trans. on Elec. Comp., EC-8, No. 2, 125 (1959).
[7]
D. R. Cox and W. L. Smith, "On the Superposition of Renewal Processes," Biometrika 4, No. 1, 99 (1954).
[8]
M. Cohn, "Redundancy in Complex Computers," Proceedings of the National Conference on Aeronautical Electronics, Dayton, Ohio, May, 1956, pp. 231-235.
[9]
W. G. Brown, J. Tierney and R. Wasserman, "Improvement of Electronic-Computer Reliability Through the Use of Redundancy." IRE Trans. on Elec. Comp., EC-10, No. 3, 407 (1961).
[10]
G. Buzzell, W. Nutting and R. Wasserman, "Majority Gate Logic Improves Digital Systems Reliability," 1961 IRE National Convention Record, Part II. p. 264.
[11]
W. C. Mann, "Systematically Introduced Redundancy in Logical Systems." 1961 IRE National Conuention Record, Part II. p. 241.
[12]
S. Muroga, "Preliminary Study of the Probabilistic Behavior of a Digital Network with Majority Decision Elements," Rome Air Development Center, RADC-TN-60-146, August 1960.
[13]
L. A. M. Verbeck, "Reliable Computation with Unreliable Circuitry." Proceedings of the First Bionics Symposium, Sept. 1960, PP. 83-92.

Cited By

View all
  • (2024)Design Exploration of Fault-Tolerant Deep Neural Networks Using Posit Number Representation SystemIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2024.339655532:7(1350-1363)Online publication date: 1-Jul-2024
  • (2024)FTC: A Universal Framework for Fault-Injection Attack Detection and PreventionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2024.338453132:7(1311-1324)Online publication date: 1-Jul-2024
  • (2024)Which Attacks Lead to Hazards? Combining Safety and Security Analysis for Cyber-Physical SystemsIEEE Transactions on Dependable and Secure Computing10.1109/TDSC.2023.330977821:4(2526-2540)Online publication date: 1-Jul-2024
  • Show More Cited By

Recommendations

Comments

Information & Contributors

Information

Published In

cover image IBM Journal of Research and Development
IBM Journal of Research and Development  Volume 6, Issue 2
April 1962
114 pages

Publisher

IBM Corp.

United States

Publication History

Published: 01 April 1962
Revised: 15 August 1961
Received: 01 September 1959

Qualifiers

  • Article

Contributors

Other Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

  • Downloads (Last 12 months)0
  • Downloads (Last 6 weeks)0
Reflects downloads up to 22 Sep 2024

Other Metrics

Citations

Cited By

View all
  • (2024)Design Exploration of Fault-Tolerant Deep Neural Networks Using Posit Number Representation SystemIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2024.339655532:7(1350-1363)Online publication date: 1-Jul-2024
  • (2024)FTC: A Universal Framework for Fault-Injection Attack Detection and PreventionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2024.338453132:7(1311-1324)Online publication date: 1-Jul-2024
  • (2024)Which Attacks Lead to Hazards? Combining Safety and Security Analysis for Cyber-Physical SystemsIEEE Transactions on Dependable and Secure Computing10.1109/TDSC.2023.330977821:4(2526-2540)Online publication date: 1-Jul-2024
  • (2024)Toward Critical Flip-Flop Identification for Soft-Error Tolerance With Graph Neural NetworksIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.333196843:4(1135-1148)Online publication date: 1-Apr-2024
  • (2024)Fault-tolerant and error-correcting 4-bit S-boxes for cryptography applications with multiple errors detectionThe Journal of Supercomputing10.1007/s11227-023-05530-780:2(1464-1490)Online publication date: 1-Jan-2024
  • (2023)Fault-tolerance at your Finger Tips with the TeamPlay Coordination LanguageProceedings of the 35th Symposium on Implementation and Application of Functional Languages10.1145/3652561.3652571(1-13)Online publication date: 29-Aug-2023
  • (2023)Characterizing and Improving Resilience of Accelerators to Memory Errors in Autonomous RobotsACM Transactions on Cyber-Physical Systems10.1145/36278288:3(1-33)Online publication date: 23-Oct-2023
  • (2023)Recovering Detectable Uncorrectable Errors via Spatial Data PredictionProceedings of the SC '23 Workshops of The International Conference on High Performance Computing, Network, Storage, and Analysis10.1145/3624062.3624120(507-515)Online publication date: 12-Nov-2023
  • (2023)A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design AutomationACM Transactions on Design Automation of Electronic Systems10.1145/356339128:2(1-57)Online publication date: 6-Mar-2023
  • (2023)Structural Models for Failure Detection of Moore Finite-State MachinesJournal of Computer and Systems Sciences International10.1134/S106423072306010262:6(977-990)Online publication date: 1-Dec-2023
  • Show More Cited By

View Options

View options

Get Access

Login options

Media

Figures

Other

Tables

Share

Share

Share this Publication link

Share on social media