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- research-articleAugust 2020
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations
- Nektar Xama,
- Martin Andraud,
- Jhon Gomez,
- Baris Esen,
- Wim Dobbelaere,
- Ronny Vanhooren,
- Anthony Coyette,
- Georges Gielen
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 25, Issue 5Article No.: 47, Pages 1–27https://doi.org/10.1145/3408063Safety-critical and mission-critical systems, such as airplanes or (semi-)autonomous cars, are relying on an ever-increasing number of embedded integrated circuits. Consequently, there is a need for complete defect coverage during the testing of these ...
