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- articleDecember 2001
Generation of Electrically Induced Stimuli for MEMS Self-Test
Journal of Electronic Testing: Theory and Applications (JELT), Volume 17, Issue 6Pages 459–470https://doi.org/10.1023/A:1012860420235A major task for the implementation of Built-In-Self-Test (BIST) strategies for MEMS is the generation of the test stimuli. These devices can work in different energy domains and are thus designed to sense signals which are generally not electrical. In ...
- ArticleApril 1997
Integrating on-chip temperature sensors into DfT schemes and BIST architectures
The continuously increasing power densities in integrated circuits necessitated the introduction of DfTT (Design for Thermal Testability) design methodology to prevent overheating effects. Newly developed CMOS temperature sensors enable the application ...