Export Citations
Save this search
Please login to be able to save your searches and receive alerts for new content matching your search criteria.
- research-articleMarch 2013
Overcoming post-silicon validation challenges through quick error detection (QED)
Existing post-silicon validation techniques are generally ad hoc, and their cost and complexity are rising faster than design cost. Hence, systematic approaches to post-silicon validation are essential. Our research indicates that many of the ...
- research-articleJune 2012
Quick detection of difficult bugs for effective post-silicon validation
DAC '12: Proceedings of the 49th Annual Design Automation ConferencePages 561–566https://doi.org/10.1145/2228360.2228461We present a new technique for systematically creating postsilicon validation tests that quickly detect bugs in processor cores and uncore components (cache controllers, memory controllers, on-chip networks) of multi-core System on Chips (SoCs). Such ...