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- research-articleJanuary 2024
Inclusion Depth for Contour Ensembles
- Nicolas F. Chaves-de-Plaza,
- Prerak Mody,
- Marius Staring,
- René van Egmond,
- Anna Vilanova,
- Klaus Hildebrandt
IEEE Transactions on Visualization and Computer Graphics (ITVC), Volume 30, Issue 9Pages 6560–6571https://doi.org/10.1109/TVCG.2024.3350076Ensembles of contours arise in various applications like simulation, computer-aided design, and semantic segmentation. Uncovering ensemble patterns and analyzing individual members is a challenging task that suffers from clutter. Ensemble statistical ...