Design space exploration (DSE) is a key activity in embedded design processes, where a mapping between applications and platforms that meets the process design requirements must be found. Finding such mappings is very challenging due to the complexity of ...

The advanced manufacturing industry (AMI) faces many unique challenges from the cyber-physical domain. Security threats are originated from two integral parts: software and hardware. Over the past decade, software security has been addressed extensively, ...

In this article, we consider the problem of droplet routing for Microelectrode-Dot-Array (MEDA) biochips. MEDA biochips today provide a host of useful features for droplet movement by making it possible to manoeuvre droplets at a much finer granularity ...

This article describes a design-for-testability approach for increasing the transition fault coverage of multi-cycle broadside tests. Earlier methods addressed two-cycle tests. The importance of multi-cycle tests results from the ability to produce more ...

This article studies the generation of low-power skewed-load tests such that the signal transitions (and line values) they create during their fast functional clock cycles match those of functional broadside tests. Functional broadside tests create ...

Reducing energy consumption in multiprocessor systems-on-chip (MPSoCs) where communication happens via the network-on-chip (NoC) approach calls for multiple voltage/frequency island (VFI)-based designs. In turn, such multi-VFI architectures need ...

An interval-mathematic approach is presented for frequency-domain simulation and sensitivity analysis of linear analog circuits under parameter variations. With uncertain parameters represented as intervals, bounding frequency-domain responses is ...