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- research-articleFebruary 2025
Unveiling Cross-checking Opportunities in Verilog Compilers
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 30, Issue 2Article No.: 32, Pages 1–23https://doi.org/10.1145/3715325The landscape of Verilog toolchains for electronic design automation (EDA) is diverse, and their reliability is crucial, as errors can lead to significant debugging challenges and delays in development. Methodologies such as testing and formal ...
- research-articleJanuary 2025JUST ACCEPTED
MESSI: Task Mapping and Scheduling Strategy for FPGA-based Heterogeneous Real-Time Systems
ACM Transactions on Design Automation of Electronic Systems (TODAES), Just Accepted https://doi.org/10.1145/3715323Continuous demands for improved performance within constrained resource budgets are driving a move from homogeneous to heterogeneous processing platforms for the implementation of today’s Real-Time (RT) embedded systems. The applications executing on such ...
- research-articleDecember 2024
Fast Candidate Screening for Post-diagnosis Refinement
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 30, Issue 1Article No.: 9, Pages 1–21https://doi.org/10.1145/3698197Oftentimes fault candidates produced by logic diagnosis are too many to effectively guide the follow-on failure analysis. In this work, we propose a novel two-stage fast screening method to sift through a large of candidates in the fault callout outputted ...
- research-articleOctober 2024
Placement Flow Study and Detailed Placement for Hybrid-Row-Height Designs
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 6Article No.: 102, Pages 1–22https://doi.org/10.1145/3690385At the 3 nm node, a hybrid-row-height design paradigm has emerged for better power efficiency and performance optimization. A diverse cell library that includes multiple variants of a cell with different fin counts is available. Instead of using cells ...
- research-articleOctober 2024
Transfer Learning Enabled Modeling Paradigm for PVT-aware Circuit Performance Estimation
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 6Article No.: 101, Pages 1–33https://doi.org/10.1145/3689435Designing robust performance models for modern complex digital circuits in the face of rapidly accelerating process variations is a critical yet demanding task. This paper introduces an efficient statistical performance modeling approach for VLSI digital ...
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- research-articleAugust 2024
MAB-BMC: A Formal Verification Enhancer by Harnessing Multiple BMC Engines Together
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 5Article No.: 75, Pages 1–37https://doi.org/10.1145/3675168In recent times, Bounded Model Checking (BMC) engines have gained wide prominence in formal verification. Different BMC engines exist, differing in their optimization, representations and solving mechanisms used to represent and navigate the underlying ...
- research-articleAugust 2024
Translating Test Responses to Images for Test-termination Prediction via Multiple Machine Learning Strategies
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 5Article No.: 74, Pages 1–26https://doi.org/10.1145/3661310Failure diagnosis is a software-based, data-driven procedure. Collecting an excessive amount of fail data not only increases the overall test cost but can also potentially reduce diagnostic resolution. Thus, test-termination prediction is proposed to ...
- research-articleAugust 2024
Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 5Article No.: 73, Pages 1–23https://doi.org/10.1145/3659950Transistor aging leads to the deterioration of analog circuit performance over time. The worst aging degradation is used to evaluate the circuit reliability. It is extremely expensive to obtain it since several circuit stimuli need to be simulated. The ...
- research-articleJuly 2024
Applying reinforcement learning to learn best net to rip and re-route in global routing
- Upma Gandhi,
- Erfan Aghaeekiasaraee,
- Sahir,
- Payam Mousavi,
- Ismail S. K. Bustany,
- Mathew E. Taylor,
- Laleh Behjat
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 4Article No.: 69, Pages 1–21https://doi.org/10.1145/3664286Physical designers typically employ heuristics to solve challenging problems in global routing. However, these heuristic solutions are not adaptable to the ever-changing fabrication demands, and the experience and creativity of designers can limit their ...
- research-articleFebruary 2024
GAN-Place: Advancing Open Source Placers to Commercial-quality Using Generative Adversarial Networks and Transfer Learning
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 2Article No.: 32, Pages 1–17https://doi.org/10.1145/3636461Recently, GPU-accelerated placers such as DREAMPlace and Xplace have demonstrated their superiority over traditional CPU-reliant placers by achieving orders of magnitude speed up in placement runtime. However, due to their limited focus in placement ...
- research-articleDecember 2023
A Machine Learning Approach to Improving Timing Consistency between Global Route and Detailed Route
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 1Article No.: 18, Pages 1–25https://doi.org/10.1145/3626959Due to the unavailability of routing information in design stages prior to detailed routing (DR), the tasks of timing prediction and optimization pose major challenges. Inaccurate timing prediction wastes design effort, hurts circuit performance, and may ...
- research-articleNovember 2023
MOEA/D vs. NSGA-II: A Comprehensive Comparison for Multi/Many Objective Analog/RF Circuit Optimization through a Generic Benchmark
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 29, Issue 1Article No.: 15, Pages 1–23https://doi.org/10.1145/3626096Thanks to the enhanced computational capacity of modern computers, even sophisticated analog/radio frequency (RF) circuit sizing problems can be solved via electronic design automation (EDA) tools. Recently, several analog/RF circuit optimization ...
- research-articleOctober 2023
Sequential Routing-based Time-division Multiplexing Optimization for Multi-FPGA Systems
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 6Article No.: 104, Pages 1–10https://doi.org/10.1145/3626322Multi-field programming gate array (FPGA) systems are widely used in various circuit design-related areas, such as hardware emulation, virtual prototypes, and chiplet design methodologies. However, a physical resource clash between inter-FPGA signals and ...
- research-articleSeptember 2023
MEDUSA: A Multi-Resolution Machine Learning Congestion Estimation Method for 2D and 3D Global Routing
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 5Article No.: 73, Pages 1–25https://doi.org/10.1145/3590768Routing congestion is one of the many factors that need to be minimized during the physical design phase of large integrated circuits. In this article, we propose a novel congestion estimation method, called MEDUSA, that consists of three parts: (1) a ...
- research-articleSeptember 2023
DRC-SG 2.0: Efficient Design Rule Checking Script Generation via Key Information Extraction
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 5Article No.: 80, Pages 1–18https://doi.org/10.1145/3594666Design Rule Checking (DRC) is a critical step in integrated circuit design. DRC requires formatted scripts as the input to design rule checkers. However, these scripts are manually generated in the foundry, which is tedious and error prone for generation ...
- research-articleJuly 2023
Harmonic Estimation and Comparative Analysis of Ultra-High Speed Flip-Flop and Latch Topologies for Low Power and High Performance Future Generation Micro-/Nano Electronic Systems
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 4Article No.: 64, Pages 1–17https://doi.org/10.1145/3590770This paper presents estimation and analysis of the higher order harmonics, power features, and real performance of flip-flop and master-slave latch topologies. This research article outlines the impact of transistor model quality and input signal ...
- research-articleMay 2023
ECO-GNN: Signoff Power Prediction Using Graph Neural Networks with Subgraph Approximation
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 4Article No.: 55, Pages 1–22https://doi.org/10.1145/3569942Modern electronic design automation flows depend on both implementation and signoff tools to perform timing-constrained power optimization through Engineering Change Orders (ECOs), which involve gate sizing and threshold-voltage (Vth)-assignment of ...
- research-articleMarch 2023
Efficient Test Chip Design via Smart Computation
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 2Article No.: 22, Pages 1–31https://doi.org/10.1145/3558393Submitted to the Special Issue on Machine Learning for CAD (ML-CAD). Competitive strength in semiconductor field depends on yield. The challenges associated with designing and manufacturing of leading-edge integrated circuits (ICs) have increased that ...
- surveyFebruary 2023
A Comprehensive Survey on Electronic Design Automation and Graph Neural Networks: Theory and Applications
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 2Article No.: 15, Pages 1–27https://doi.org/10.1145/3543853Driven by Moore’s law, the chip design complexity is steadily increasing. Electronic Design Automation (EDA) has been able to cope with the challenging very large-scale integration process, assuring scalability, reliability, and proper time-to-market. ...
- research-articleDecember 2022
Performance-driven Wire Sizing for Analog Integrated Circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 28, Issue 2Article No.: 19, Pages 1–23https://doi.org/10.1145/3559542Analog IC performance has a strong dependence on interconnect RC parasitics, which are significantly affected by wire sizes in recent technologies, where minimum-width wires have high resistance. However, performance-driven wire sizing for analog ICs has ...