Hardware reliability

Location via proxy: [ UP ]
[Report a bug] [Manage cookies] No cookies No scripts No ads No referrer Show this form

skip to main content

Advanced Search
Browse
About
- Sign in
- Register

Advanced Search
Journals
Magazines
Proceedings
Books
SIGs
Conferences
People
More

Search ACM Digital Library

Hardware reliability Results

Search

Advanced Search

Applied Filters

Hardware reliability
DATE '00: Proceedings of the conference on Design, automation and test in EuropeRemove filter

People

Names

Axel Jantsch (2)
Irith Pomeranz (2)
Per Bjuréus (2)
Sudhakar Mannapuram Reddy (2)
Alper Demir (1)
Andrew M D Richardson (1)
Elizabeth M Rudnick (1)
Gary D Hachtel (1)
Joan E Carletta (1)
Klaus Schneider (1)
Marina Santo Santo-Zarnik (1)
Michael Nicolaïdis (1)
Paolo Prinetto (1)
Praveen Yalagandula (1)
Silvia Cataldo (1)
Silvia Chiusano (1)
Timothy J Bergfeld (1)
Vigyan Singhal (1)
Yervant Zorian Zorian (1)
Yves Bertrand (1)

Institutions

KTH Royal Institute of Technology (2)
Nokia Bell Labs (2)
Polytechnic of Turin (2)
University of Iowa (2)
Case Western Reserve University (1)
Federal University of Rio Grande do Sul (1)
Fraunhofer Institute for Microelectronic Circuits and Systems IMS (1)
Gottfried Wilhelm Leibniz University Hannover (1)
Higher Technical Institute (1)
Motorola Austin (1)
National Cheng Kung University (1)
Sorbonne University (1)
Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) (1)
The University of Texas at Austin (1)
The University of Texas at Dallas (1)
University of Castilla-La Mancha (1)
University of Colorado Boulder (1)
University of Illinois Urbana-Champaign (1)
University of Massachusetts Amherst (1)
Warsaw University of Technology (1)

Authors

Axel Jantsch (2)
Irith Pomeranz (2)
Per Bjuréus (2)
Sudhakar Mannapuram Reddy (2)
Alper Demir (1)
Andrew M D Richardson (1)
Elizabeth M Rudnick (1)
Gary D Hachtel (1)
Joan E Carletta (1)
Klaus Schneider (1)
Marina Santo Santo-Zarnik (1)
Michael Nicolaïdis (1)
Paolo Prinetto (1)
Praveen Yalagandula (1)
Silvia Cataldo (1)
Silvia Chiusano (1)
Timothy J Bergfeld (1)
Vigyan Singhal (1)
Yervant Zorian Zorian (1)
Yves Bertrand (1)

Publications

Proceedings/Book Names

DATE '00: Proceedings of the conference on Design, automation and test in Europe (38)

All Publications

Proceedings (38)

Media Formats

PDF (37)

Publisher

Association for Computing Machinery (38)

Conferences

Sponsors

EDAA (38)
EDAC (38)
IEEE-CS (38)
IFIP (38)
SIGDA (38)
THE RUSSIAN ACADEMY OF SCIENCES (38)

Conference Event

DATE00 (38)

Proceedings Series

DATE: Design, Automation, and Test in Europe (38)

Publication Date

Upon changing this filter the page will automatically refresh

Export Citations

Selected
All Results

Select Citation format

Please download or close your previous search result export first before starting a new bulk export.
Preview is not available.
By clicking download,a status dialog will open to start the export process. The process may takea few minutes but once it finishes a file will be downloadable from your browser. You may continue to browse the DL while the export process is in progress.
Download
- Download citation
- Copy citation

38 Results for: Book/Issue: DATE '00: Proceedings of the conference on Design, automation and test in EuropeEdit SearchSave SearchFailed to save your search, try again laterSearch has been saved (My Saved Searches)RSS

Save this search

Please login to be able to save your searches and receive alerts for new content matching your search criteria.

Searched The ACM Guide to Computing Literature (3,802,460 records)|Limit your search to The ACM Full-Text Collection (772,006 records)

Results

Showing 1 - 20of38 Results

Select All

Export Citations Save to Binder

Save to Binder

Create a New Binder

Name

per page:

10
20
50

Sort by: Recency

Earliest
Latest
Downloaded
Cited

Article
Free
January 2000
On-line testing and diagnosis of bus lines with respect to intermediate voltage values (poster paper)
DATE '00: Proceedings of the conference on Design, automation and test in EuropePage 763https://doi.org/10.1145/343647.344351
0
78
Metrics
Total Citations0
Total Downloads78
Last 12 Months20
Last 6 weeks4
View online with eReader
PDF
Article
Free
January 2000
Improving the error detection ability of concurrent checkers by observation point insertion in the circuit under check (poster paper)
- Valery A. Vardanian,
- Liana B. Mirzoyan
DATE '00: Proceedings of the conference on Design, automation and test in EuropePage 762https://doi.org/10.1145/343647.344350
0
73
Metrics
Total Citations0
Total Downloads73
Last 12 Months22
Last 6 weeks2
View online with eReader
PDF
Article
Free
January 2000
Exploiting hierarchy for multiple error correction in combinational circuits (poster paper)
- Dirk W. Hoffman,
- Thomas Kropf
DATE '00: Proceedings of the conference on Design, automation and test in EuropePage 758https://doi.org/10.1145/343647.344346
1
104
Metrics
Total Citations1
Total Downloads104
Last 12 Months31
Last 6 weeks6
View online with eReader
PDF
Article
Free
January 2000
A versatile built-in self test scheme for delay fault testing (poster paper)
DATE '00: Proceedings of the conference on Design, automation and test in EuropePage 756https://doi.org/10.1145/343647.344343
0
73
Metrics
Total Citations0
Total Downloads73
Last 12 Months14
Last 6 weeks4
View online with eReader
PDF
Article
Free
January 2000
Testing arithmetic coprocessor in system environment
- J. Sosnowski,
- T. Bech
DATE '00: Proceedings of the conference on Design, automation and test in EuropePage 752https://doi.org/10.1145/343647.344146
0
95
Metrics
Total Citations0
Total Downloads95
Last 12 Months19
Last 6 weeks2
View online with eReader
PDF
Article
Free
January 2000
Multi-node static logic implications for redundancy identification
- Kabir Gulrajani,
- Michael S. Hsiao
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 729–735https://doi.org/10.1145/343647.344102
6
103
Metrics
Total Citations6
Total Downloads103
Last 12 Months7
Last 6 weeks0
View online with eReader
PDF
Article
Free
January 2000
Detecting undetectable controller faults using power analysis
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 723–728https://doi.org/10.1145/343647.344097
0
155
Metrics
Total Citations0
Total Downloads155
Last 12 Months42
Last 6 weeks2
View online with eReader
PDF
Article
Free
January 2000
Parametric fault simulation and test vector generation
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 650–657https://doi.org/10.1145/343647.343883
15
233
Metrics
Total Citations15
Total Downloads233
Last 12 Months19
Last 6 weeks4
View online with eReader
PDF
Article
Free
January 2000
Influence of manufacturing variations in I_DDQ measurements: a new test criterion
- Juan M. Díez,
- Juan C. López
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 645–649https://doi.org/10.1145/343647.343881
2
118
Metrics
Total Citations2
Total Downloads118
Last 12 Months24
Last 6 weeks4
View online with eReader
PDF
Article
Free
January 2000
Reducing the complexity of defect level modeling using the clustering effect
- José T. de Sousa,
- Vishwani D. Agrawal
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 640–644https://doi.org/10.1145/343647.343879
10
109
Metrics
Total Citations10
Total Downloads109
Last 12 Months23
Last 6 weeks5
View online with eReader
PDF
Article
Free
January 2000
Detection of defective sensor elements using ΣΔ -modulation and a matched filter
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 599–605https://doi.org/10.1145/343647.343865
0
176
Metrics
Total Citations0
Total Downloads176
Last 12 Months19
Last 6 weeks5
View online with eReader
PDF
Article
Free
January 2000
Cost reduction and evaluation of temporary faults detecting technique
- Lorena Anghel,
- Michael Nicolaidis
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 591–598https://doi.org/10.1145/343647.343863
60
600
Metrics
Total Citations60
Total Downloads600
Last 12 Months90
Last 6 weeks9
View online with eReader
PDF
Article
Free
January 2000
A VHDL-based methodology for the design and verification of pipeline A/D converters
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 534–538https://doi.org/10.1145/343647.343842
6
319
Metrics
Total Citations6
Total Downloads319
Last 12 Months35
Last 6 weeks8
View online with eReader
PDF
Article
Free
January 2000
Iterative abstraction-based CTL model checking
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 502–509https://doi.org/10.1145/343647.343831
9
168
Metrics
Total Citations9
Total Downloads168
Last 12 Months19
Last 6 weeks3
View online with eReader
PDF
Article
Free
January 2000
Abstraction from counters: an application on real-time systems
- G. Logothetis,
- K. Schneider
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 486–493https://doi.org/10.1145/343647.343828
4
170
Metrics
Total Citations4
Total Downloads170
Last 12 Months31
Last 6 weeks5
View online with eReader
PDF
Article
Free
January 2000
A fault simulation methodology for MEMS
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 476–485https://doi.org/10.1145/343647.343826
6
470
Metrics
Total Citations6
Total Downloads470
Last 12 Months41
Last 6 weeks7
View online with eReader
PDF
Article
Free
January 2000
Test quality and fault risk in digital filter datagraph BIST
- Laurence Goodby,
- Alex Orailoğlu
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 468–475https://doi.org/10.1145/343647.343825
0
118
Metrics
Total Citations0
Total Downloads118
Last 12 Months12
Last 6 weeks0
View online with eReader
PDF
Article
Free
January 2000
Alternative test methods using IEEE 1149.4
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 463–467https://doi.org/10.1145/343647.343823
7
170
Metrics
Total Citations7
Total Downloads170
Last 12 Months40
Last 6 weeks6
View online with eReader
PDF
Article
Free
January 2000
Functional test generation for full scan circuits
- Irith Pomeranz,
- Sudhakar M. Reddy
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 396–403https://doi.org/10.1145/343647.343808
1
142
Metrics
Total Citations1
Total Downloads142
Last 12 Months37
Last 6 weeks7
View online with eReader
PDF
Article
Free
January 2000
Automatic test bench generation for validation of RT-level descriptions: an industrial experience
DATE '00: Proceedings of the conference on Design, automation and test in EuropePages 385–389https://doi.org/10.1145/343647.343802
16
448
Metrics
Total Citations16
Total Downloads448
Last 12 Months55
Last 6 weeks8
View online with eReader
PDF

1
2

Footer

Categories

Journals
Magazines
Books
Proceedings
SIGs
Conferences
Collections
People

About

About ACM Digital Library
ACM Digital Library Board
Subscription Information
Author Guidelines
Using ACM Digital Library
All Holdings within the ACM Digital Library
ACM Computing Classification System
Accessibility Statement

Join

Join ACM
Join SIGs
Subscribe to Publications
Institutions and Libraries

Connect

Contact us via email
ACM on Facebook
ACM DL on X
ACM on Linkedin
Send Feedback
Submit a Bug Report

The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2024 ACM, Inc.

Terms of Usage
Privacy Policy
Code of Ethics

Your Search Results Download Request

We are preparing your search results for download ...

We will inform you here when the file is ready.

Your Search Results Download Request

Your file of search results citations is now ready.

Your Search Results Download Request

Your search export query has expired. Please try again.