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- research-articleOctober 2024
A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 419–433https://doi.org/10.1007/s10836-024-06132-8AbstractAs the wafer process becomes more complex, the probability of mixed-type defective wafer maps is constantly increasing. Therefore, it is necessary to perform effective filtering and denoising processing on the mixed-type defective wafer map to ...
- research-articleSeptember 2024
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 525–537https://doi.org/10.1007/s10836-024-06135-5AbstractSRAM memory systems are suffering from an increase in data due to the aggressive CMOS integration density. The frequency of Multiple Cell Upsets (MCUs) on SRAM memory is increasing, which is resulting in the increasing use of ECCs.Speed is slowed ...
- research-articleSeptember 2024
High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBM
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 557–572https://doi.org/10.1007/s10836-024-06134-6AbstractThe challenge caused by redundant feature interference in high-dimensional fault feature data of analog circuits, will undermines the efficacy of conventional analog circuit fault diagnosis techniques, Thus, a novel approach termed Heterogeneous ...
- research-articleSeptember 2024
Pebble Traversal-Based Fault Detection and Advanced Reconfiguration Technique for Digital Microfluidic Biochips
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 573–587https://doi.org/10.1007/s10836-024-06137-3AbstractDigital Microfluidic Biochips (DMFBs) are rapidly replacing conventional biomedical analyzers by incorporating diverse bioassay operations with better throughput and precision at a negligible cost. In the last decade, these microfluidic devices ...
- research-articleAugust 2024
Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 435–455https://doi.org/10.1007/s10836-024-06133-7AbstractThe semiconductor industry has encountered the physical constraints of current semiconductor materials and the impending end of Moore's forecast. The recent edition of the International Roadmap for Devices and Systems reveals that the ...
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- research-articleAugust 2024
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 487–496https://doi.org/10.1007/s10836-024-06130-wAbstractDopingless (DLFET) provides better reliability against any physically doped devices. Hence, this paper aims to provide a fair comparison between conventional junctionless (JLFET) and DLFET based ring oscillator (RO) physical unclonable function (...
- research-articleJuly 2024
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 469–485https://doi.org/10.1007/s10836-024-06129-3AbstractIn recent years, the Industrial Internet of Things (IoT) has grown significantly. Automation along with intelligence introduces a slew of cyber risks while implementing industrial digitalization. But, none of the prevailing work focused on ...
- research-articleJuly 2024
ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 457–468https://doi.org/10.1007/s10836-024-06127-5AbstractTraditional ADC dynamic parameter testing algorithms have high requirements for signal amplitude, purity, and coherence, which not only have high test cost but also low efficiency. Therefore, a set of ADC dynamic parameter testing algorithms was ...
- research-articleJuly 2024
Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 4Pages 509–523https://doi.org/10.1007/s10836-024-06126-6AbstractWith the increasing interest in embedding digital devices in safety-critical cyber-physical systems (CPSs), such as industrial automation, aerospace, and automotive industries, attention has been directed toward proposing verifiable and reliable ...
- research-articleJuly 2024
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 3Pages 405–415https://doi.org/10.1007/s10836-024-06125-7AbstractThe growing complexity of integrated circuits (ICs) brings expensive manufacturing test cost. Adaptive testing becomes an important way to save test cost by predicting die quality to reduce the actual test content. However, reducing test items ...
- research-articleJuly 2024
Design and Verification of a SAR ADC SystemVerilog Real Number Model
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 3Pages 315–328https://doi.org/10.1007/s10836-024-06124-8AbstractMixed-signal applications have emerged as a significant trend in the semiconductor industry, with considerable efforts directed towards developing fast and accurate designs that integrate both analog and digital components. However, mixed-signal ...
- research-articleJune 2024
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 3Pages 371–385https://doi.org/10.1007/s10836-024-06122-wAbstractHardware Trojans (HT) are tiny circuits designed to exploit electronic devices, posing risks such as device malfunction or leakage of sensitive information. The adversary aims to implant these HTs specifically targeting nets with minimal signal ...
- research-articleMay 2024
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach
- Esther Goudet,
- Fabio Sureau,
- Paul Breuil,
- Luis Peña Treviño,
- Lirida Naviner,
- Jean-Marc Daveau,
- Philippe Roche
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 3Pages 291–313https://doi.org/10.1007/s10836-024-06119-5AbstractThis paper studies the fault propagation and the correctness rate calculation of combinatorial circuits. We rely on circuit partitioning and on a probabilistic approach close to a binomial distribution, assuming some simultaneous faults have a ...
- research-articleMay 2024
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency Source
Journal of Electronic Testing: Theory and Applications (JELT), Volume 40, Issue 3Pages 387–403https://doi.org/10.1007/s10836-024-06118-6AbstractThe present article proposes a novel method to reduce phase noise in a PLL based X-Band source consisting of oscillating and non-oscillating components for the use in Pulse Doppler radar. It also provides phase noise performance stabilization ...
- research-articleDecember 2023
Performance Efficient and Fault Tolerant Approximate Adder
Journal of Electronic Testing: Theory and Applications (JELT), Volume 39, Issue 5-6Pages 571–582https://doi.org/10.1007/s10836-023-06092-5AbstractFault tolerant adders are an important design paradigm to improve the robustness of the adder while at the same time improving the yield. The major downside of fault tolerant adders are the additional modules that are intrinsic to this design. On ...
- research-articleDecember 2023
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field
Journal of Electronic Testing: Theory and Applications (JELT), Volume 39, Issue 5-6Pages 621–629https://doi.org/10.1007/s10836-023-06090-7AbstractSince 2007, methods that utilize side-channel data to detect hardware Trojan (HT) problems have been widely studied. Machine learning methods are widely used for hardware Trojan detection, but with the development of integrated circuits (ICs), ...
- research-articleDecember 2023
A Survey of PCB Defect Detection Algorithms
Journal of Electronic Testing: Theory and Applications (JELT), Volume 39, Issue 5-6Pages 541–554https://doi.org/10.1007/s10836-023-06091-6AbstractPrinted circuit boards (PCBs) are the first stage in manufacturing any electronic product. The reliability of the electronic product depends on the PCB. The presence of manufacturing defects in PCBs might affect the performance of the PCB and ...