The goal of this paper is to decrease the number of complicated mathematical calculations for extracting the values of parasitic components and to examine the RF behavior of CMOS circuits rapidly by proposing a simple, bias-independent, three-...

Protecting sensitive logic functions in ASICs requires side-channel countermeasures. Many gate-level masking styles have been published, each with pros and cons. Some styles such as RSM, GLUT, and ISW are compact but can feature 1st-order leakage. ...

With the development of semiconductor technology, the fabrication process of integrated circuits is complicated and expensive, and the testing of integrated circuits has become increasingly difficult. The reduction of testing costs has become a ...

The trustworthiness of integrated circuits is susceptible to the hardware Trojans in the third-party intellectual property (IP) cores. Various hardware Trojan detection approaches have been proposed to identify the Trojans from a given netlist at ...

A novel approach to achieve low power consumption during Built-In Self-Test (BIST) operations in Very Large Scale Integrated (VLSI) circuits through the integration of Generative Adversarial Networks (GANs) in the test pattern generation process ...

Plastic Ball Grid Array (PBGA) packages (chips) mounted on a Printed Circuit Board (PCB) assembly are vulnerable and are more likely to fail when they are subjected to random vibration environmental conditions. The proper positioning of the ...

Test sets that target standard fault models may not always be sufficient for detecting all defects. To evaluate test sets for the detection of unmodeled defects, n-detect test sets (which detect all modeled faults at least n times) have previously ...

An enhanced approach for detecting defects in Printed Circuit Boards (PCBs) using a significantly improved version of the YOLOv8 algorithm is proposed in this research, the proposed method is referred to as YOLOv8-TDD (You Only Look Once Version8-...

On-chip testability of superconductive electronic circuits is challenging due to the high clock frequencies and cryogenic environment, which in turn complicates the test/debug process. In this paper, circuit solutions to support design for ...

In order to investigate the reliability of gallium arsenide (GaAs) monolithic microwave integrated circuit (MMIC) low noise amplifier (LNA), a series of tests have been carried out here. The results show that with the rising temperature the small-...

Printed circuit board (PCB) is one of the most important components of electronic products. The traditional defect detection methods are very difficult to meet the defect detection requirements in the PCB production process. In recent years, the ...

The testing process of various electronic design automation tools and the verification process of the manufacturability of a developed Design Rule Check (DRC) deck, particularly in very-large-scale integration designs, is highly dependent on the ...

In a strong electromagnetic pulse environment, high-intensity, broadband electromagnetic pulse energy is transmitted to the communication interface circuit through the interconnection cable, causing interference or damage to the internal ...

This research introduces a proposed energy-efficient radiation-hardened and improved read stability (RHIRS)-12T SRAM cell with a polarity hardening technique, which lowers the vulnerable nodes and allows all single-event upset (SEU) techniques to ...

As the wafer process becomes more complex, the probability of mixed-type defective wafer maps is constantly increasing. Therefore, it is necessary to perform effective filtering and denoising processing on the mixed-type defective wafer map to ...

SRAM memory systems are suffering from an increase in data due to the aggressive CMOS integration density. The frequency of Multiple Cell Upsets (MCUs) on SRAM memory is increasing, which is resulting in the increasing use of ECCs.Speed is slowed ...

The challenge caused by redundant feature interference in high-dimensional fault feature data of analog circuits, will undermines the efficacy of conventional analog circuit fault diagnosis techniques, Thus, a novel approach termed Heterogeneous ...

Digital Microfluidic Biochips (DMFBs) are rapidly replacing conventional biomedical analyzers by incorporating diverse bioassay operations with better throughput and precision at a negligible cost. In the last decade, these microfluidic devices ...

The semiconductor industry has encountered the physical constraints of current semiconductor materials and the impending end of Moore's forecast. The recent edition of the International Roadmap for Devices and Systems reveals that the ...