Abstract
In this paper, a new multi-level technique, based on alternative graphs, with uniform procedures at each level for test generation, fault simulation and fault diagnosis in finite state machines (FSM) is presented. For the description of function (behavior), structure and faults in FSM, three levels are used: functional (state transition diagrams), logical (signal path) and gate levels. In test generation, simultaneously all levels are used. Faults from different classes are inserted and activated at different levels by uniform procedures. State initialization and fault propagation are carried out only at the functional level. Backtracking will not cross level borders, hence, the high efficiency of test generation can be reached. Fault diagnosis is carried out using top-down technique, keeping the complexity of candidate fault sets in each level as low as possible.
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© 1996 Springer-Verlag Berlin Heidelberg
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Ubar, R., Brik, M. (1996). Multi-level test generation and fault diagnosis for finite state machines. In: Hlawiczka, A., Silva, J.G., Simoncini, L. (eds) Dependable Computing — EDCC-2. EDCC 1996. Lecture Notes in Computer Science, vol 1150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-61772-8_43
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DOI: https://doi.org/10.1007/3-540-61772-8_43
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