Overview
- Provides a systematic treatment of predictive modeling and design prototyping, from the fundamental concept to practical benchmarks
- Includes a complete and quantitative vision on the opportunities and limits of technology scaling toward the 10nm regime Addresses the emergent modeling and design needs under ever-increasing variability and reliability concerns
- Covers state-of-the-art compact modeling solutions for CMOS alternatives and post-silicon devices, enabling exploratory design activities beyond traditional CMOS Discusses the seamless integration of the process/materials development and circuit simulation that supports concurrent technology-design research
- Includes supplementary material: sn.pub/extras
Part of the book series: Integrated Circuits and Systems (ICIR)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
About this book
Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.Â
Similar content being viewed by others
Keywords
Table of contents (10 chapters)
-
Front Matter
-
Back Matter
Authors and Affiliations
Bibliographic Information
Book Title: Predictive Technology Model for Robust Nanoelectronic Design
Authors: Yu Cao
Series Title: Integrated Circuits and Systems
DOI: https://doi.org/10.1007/978-1-4614-0445-3
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media, LLC 2011
Hardcover ISBN: 978-1-4614-0444-6Published: 12 July 2011
Softcover ISBN: 978-1-4614-3021-6Published: 15 August 2013
eBook ISBN: 978-1-4614-0445-3Published: 12 July 2011
Series ISSN: 1558-9412
Series E-ISSN: 1558-9420
Edition Number: 1
Number of Pages: XV, 173
Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation, Nanotechnology, Performance and Reliability