Abstract
Atomic force microscope (AFM) is a promising tool in micro and nano size objects researches. Contact mode AFM has advantages comparing to non-contact modes: the scanning speed is higher, and atomic resolution can be achieved. The main limiting factor in contact mode AFM is scanning speed. At high scanning speed the ‘loss of contact’ phenomenon occurs, and probe in this case cannot follow the surface. In order to ensure a constant interaction force (stable contact) between the probe and scanned surface, the additional force created by air flow was applied. Proposed method is based on the idea to apply additional controllable nonlinear force on the upper surface of the AFM cantilever, which will help to keep the probe in contact with sample surface. It was found that dynamic characteristics of various AFM sensor cantilevers can be controlled using proposed method. It has been determined that the use of aerodynamic force has the greatest influence on the scanning results deviation from the real sample in the horizontal direction then scanner z axis goes down. With a compressed air pressure of 7 kPa and a scanning speed 847.6 μm/s, this deviation decreases by 20% comparing to the case when compressed air flow is not used.
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References
Morkvenaite-Vilkonciene, I., Ramanavicius, A., Ramanaviciene, A.: Atomic force microscopy as a tool for the investigation of living cells. Medicina 49, 155–164 (2013)
Fujii, S.: Atomic force microscope. In: Compendium of Surface and Interface Analysis. Springer, Singapore (2018)
Haase, K., Pelling, A.E.: Investigating cell mechanics with atomic force microscopy. J. R. Soc. Interface 12(104), 20140970 (2015)
Bučinskas, V., Dzedzickis, A., Šešok, N., Šutinys, E., Iljin, I.: Research of modified mechanical sensor of atomic force microscope. In: Dynamical Systems: Theoretical and Experimental Analysis. Springer, Cham (2016)
Yang, H. (ed.): Atomic Force Microscopy (AFM): Principles, Modes of Operation and Limitations. Nova Science Publishers, Hauppauge (2014). Incorporated
Voigtländer, B.: Scanning Probe Microscopy. Springer, Berlin (2016)
Gonnelli, R.S.: Atomic force microscopy in the surface characterization of semiconductors and superconductors. Phil. Mag. B 80(4), 599–609 (2000)
Schillers, H., Rianna, C., Schäpe, J., Luque, T., Doschke, H., Wälte, M., Dumitru, A.: Standardized nanomechanical atomic force microscopy procedure (SNAP) for measuring soft and biological samples. Sci. Rep. 7(1), 5117 (2017)
Quénet, D., Dimitriadis, E.K., Dalal, Y.: Atomic force microscopy of chromatin. In: Atomic Force Microscopy Investigations into Biology-from Cell to Protein. InTech (2012)
Materials and Structure Property Correlation Assignment No. 2. http://www.mecheng.iisc.ernet.in/~bobji/mspc/assign_2011/Atomic%20force%20microscopy.pdf. Accessed 15 Oct 2018
Adams, J.D., Nievergelt, A., Erickson, B.W., Yang, C., Dukic, M., Fantner, G.E.: High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers. Rev. Sci. Instrum. 85(9), 093702 (2014)
Tien, S., Zou, Q., Devasia, S.: Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation. IEEE Trans. Control Syst. Technol. 13(6), 921–931 (2005)
Richter, C., Burri, M., Sulzbach, T., Penzkofer, C., Irmer, B.: Ultrashort cantilever probes for high-speed atomic force microscopy. SPIE Newsroom (2011)
Butt, H.J., Cappella, B., Kappl, M.: Force measurements with the atomic force microscope: technique, interpretation and applications. Surf. Sci. Rep. 59(1–6), 1–152 (2005)
Dzedzickis, A., Bucinskas, V., Viržonis, D., Sesok, N., Ulcinas, A., Iljin, I., Morkvenaite-Vilkonciene, I.: Modification of the AFM sensor by a precisely regulated air stream to increase imaging speed and accuracy in the contact mode. Sensors 18(8), 2694 (2018)
Dzedzickis, A., Bučinskas, V., Eok, N., Iljin, I.: Modelling of mechanical structure of atomic force microscope. Solid State Phenom. 251, 77–82 (2016)
Bučinskas, V., Dzedzickis, A., Šutinys, E., Lenkutis, T.: Implementation of different gas influence for operation of modified atomic force microscope sensor. Solid State Phenom. 260, 99–104 (2017)
Bučinskas, V., Dzedzickis, A., Šutinys, E., Šešok, N., Iljin, I.: Experimental research of improved sensor of atomic force microscope. In: International Conference on Systems, Control and Information Technologies, pp. 601–609. Springer, Cham (2016)
Ulčinas, A., Vaitekonis, Š.: Rotational scanning atomic force microscopy. Nanotechnology 28(10), 10LT02 (2017)
Acknowledgement
This research was funded by the European Social Fund according to the activity “Development of Competences of Scientists, other Researchers and Students through Practical Research Activities” of Measure No. 09.3.3-LMT-K-712. Project No 09.3.3-LMT-K-712-02-0137.
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Dzedzickis, A., Bučinskas, V., Lenkutis, T., Morkvėnaitė-Vilkončienė, I., Kovalevskyi, V. (2020). Increasing Imaging Speed and Accuracy in Contact Mode AFM. In: Szewczyk, R., Zieliński, C., Kaliczyńska, M. (eds) Automation 2019. AUTOMATION 2019. Advances in Intelligent Systems and Computing, vol 920. Springer, Cham. https://doi.org/10.1007/978-3-030-13273-6_55
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DOI: https://doi.org/10.1007/978-3-030-13273-6_55
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