Abstract
We propose a novel approach to recovering translucent objects from a single time-of-flight (ToF) depth camera using deep residual networks. When recording translucent objects using the ToF depth camera, their depth values are severely contaminated due to complex light interactions with surrounding environment. While existing methods suggested new capture systems or developed the depth distortion models, their solutions were less practical because of strict assumptions or heavy computational complexity. In this paper, we adopt deep residual networks for modeling the ToF depth distortion caused by translucency. To fully utilize both the local and semantic information of objects, multi-scale patches are used to predict the depth value. Based on the quantitative and qualitative evaluation on our benchmark database, we show the effectiveness and robustness of the proposed algorithm.
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References
Belhedi, A., Bartoli, A., Bourgeois, S., Gay-Bellile, V., Hamrouni, K., Sayd, P.: Noise modelling in time-of-flight sensors with application to depth noise removal and uncertainty estimation in three-dimensional measurement. IET Comput. Vis. 9(6), 967–977 (2015)
Cao, Y., Wu, Z., Shen, C.: Estimating depth from monocular images asclassification using deep fully convolutional residual networks. IEEE Trans. Circ. Syst. Video Technol. 28(11), 3174–3182 (2017)
Clark, J., Trucco, E., Wolff, L.B.: Using light polarization in laser scanning. Image Vis. Comput. 15(2), 107–117 (1997)
Feigin, M., Bhandari, A., Izadi, S., Rhemann, C., Schmidt, M., Raskar, R.: Resolving multipath interference in kinect: an inverse problem approach. IEEE Sens. J. 16, 3419–3427 (2015)
Francesco, F.S.R., Christoph, R., Murthy, K.A.P., Vladimir, T., David, K., Shahram, I.: Determining depth from structured light using trained classifiers. https://lens.org/103-012-483-114-400
Fujimura, Y., Iiyama, M., Hashimoto, A., Minoh, M.: Photometric stereo in participating media considering shape-dependent forward scatter. arXiv preprint arXiv:1804.02836 (2018)
Gatys, L.A., Ecker, A.S., Bethge, M.: Image style transfer using convolutional neural networks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2414–2423 (2016)
Hartmann, W., Galliani, S., Havlena, M., Van Gool, L., Schindler, K.: Learned multi-patch similarity. In: International Conference on Computer Vision (ICCV) 2017 (2017)
He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770–778 (2016)
Hullin, M.B., Fuchs, M., Ihrke, I., Seidel, H.P., Lensch, H.P.: Fluorescent immersion range scanning. ACM Trans. Graph. 27(3), 87–1 (2008)
Iizuka, S., Simo-Serra, E., Ishikawa, H.: Globally and locally consistent image completion. ACM Trans. Graph. (TOG) 36(4), 107 (2017)
Ioffe, S., Szegedy, C.: Batch normalization: accelerating deep network training by reducing internal covariate shift. In: International Conference on Machine Learning, pp. 448–456 (2015)
Kim, J., Reshetouski, I., Ghosh, A.: Acquiring axially-symmetric transparent objects using single-view transmission imaging. In: 30th IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2017)
Kim, K., Shim, H.: Robust approach to reconstructing transparent objects using a time-of-flight depth camera. Opt. Exp. 25(3), 2666–2676 (2017)
Kohler, J., Daneshmand, H., Lucchi, A., Zhou, M., Neymeyr, K., Hofmann, T.: Towards a theoretical understanding of batch normalization. arXiv preprint arXiv:1805.10694 (2018)
Krizhevsky, A., Sutskever, I., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 1097–1105 (2012)
Lee, J.H., Heo, M., Kim, K.R., Kim, C.S.: Single-image depth estimation based on fourier domain analysis. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 330–339 (2018)
Li, B., Dai, Y., Chen, H., He, M.: Single image depth estimation by dilated deep residual convolutional neural network and soft-weight-sum inference. arXiv preprint arXiv:1705.00534 (2017)
Liao, J., Yao, Y., Yuan, L., Hua, G., Kang, S.B.: Visual attribute transfer through deep image analogy. arXiv preprint arXiv:1705.01088 (2017)
Lysenkov, I., Eruhimov, V., Bradski, G.: Recognition and pose estimation of rigid transparent objects with a kinect sensor. Robotics 273, 273–280 (2013)
Maeno, K., Nagahara, H., Shimada, A., Taniguchi, R.I.: Light field distortion feature for transparent object recognition. In: IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 2786–2793. IEEE (2013)
Marco, J., et al.: Deeptof: off-the-shelf real-time correction of multipath interference in time-of-flight imaging. ACM Trans. Graph. (TOG) 36(6), 219 (2017)
Nah, S., Kim, T.H., Lee, K.M.: Deep multi-scale convolutional neural network for dynamic scene deblurring, vol. 3. arXiv preprint arXiv:1612.02177 (2016)
Naik, N., Kadambi, A., Rhemann, C., Izadi, S., Raskar, R., Bing Kang, S.: A light transport model for mitigating multipath interference in time-of-flight sensors. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 73–81 (2015)
Santurkar, S., Tsipras, D., Ilyas, A., Madry, A.: How does batch normalization help optimization? (no, it is not about internal covariate shift). arXiv preprint arXiv:1805.11604 (2018)
Sarbolandi, H., Lefloch, D., Kolb, A.: Kinect range sensing: structured-light versus time-of-flight kinect. Comput. Vis. Image Underst. 139, 1–20 (2015)
Seib, V., Barthen, A., Marohn, P., Paulus, D.: Friend or foe: exploiting sensor failures for transparent object localization and classification. In: International Conference on Robotics and Machine Vision, vol. 10253, p. 102530I. International Society for Optics and Photonics (2017)
Shim, H., Lee, S.: Recovering translucent objects using a single time-of-flight depth camera. IEEE Trans. Circ. Syst. Video Technol. 26(5), 841–854 (2016)
Su, S., Heide, F., Wetzstein, G., Heidrich, W.: Deep end-to-end time-of-flight imaging. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 6383–6392 (2018)
Tanaka, K., Mukaigawa, Y., Kubo, H., Matsushita, Y., Yagi, Y.: Recovering transparent shape from time-of-flight distortion. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4387–4395 (2016)
Tieleman, T., Hinton, G.: Lecture 6.5-RmsProp: divide the gradient by a running average of its recent magnitude. COURSERA: Neural Netw. Mach. Learn. 4(2), 26–31 (2012)
Torres-Gómez, A., Mayol-Cuevas, W.: Recognition and reconstruction of transparent objects for augmented reality. In: 2014 IEEE International Symposium on Mixed and Augmented Reality (ISMAR), pp. 129–134. IEEE (2014)
Wang, T., He, X., Barnes, N.: Glass object localization by joint inference of boundary and depth. In: 21st International Conference on Pattern Recognition (ICPR), pp. 3783–3786. IEEE (2012)
Acknowledgement
This research was supported by the MSIP (Ministry of Science, ICT and Future Planning), Korea, under the University Information Technology Research Center support program (IITP-2016-R2718-16-0014) supervised by the IITP, by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the MSIP (NRF-2016R1A2B4016236), and also by the MIST(Ministry of Science and ICT), Korea, under the “ICT Consilience Creative Program” (IITP-2018-2017-0-01015) supervised by the IITP(Institute for Information & communications Technology Promotion).
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Song, S., Shim, H. (2019). Depth Reconstruction of Translucent Objects from a Single Time-of-Flight Camera Using Deep Residual Networks. In: Jawahar, C., Li, H., Mori, G., Schindler, K. (eds) Computer Vision – ACCV 2018. ACCV 2018. Lecture Notes in Computer Science(), vol 11365. Springer, Cham. https://doi.org/10.1007/978-3-030-20873-8_41
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