Overview
- State of the art of microwave reflectometry based methods for diagnostics and monitoring applications
- Major practical applications of reflectometry and related results are discussed
- Written by leading experts in the field
Part of the book series: Lecture Notes in Electrical Engineering (LNEE, volume 93)
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About this book
This book is dedicated to the adoption of broadband microwave reflectometry (BMR)-based methods for diagnostics and monitoring applications. This electromagnetic technique has established as a powerful tool for monitoring purposes; in fact, it can balance several contrasting requirements, such as the versatility of the system, low implementation cost, real-time response, possibility of remote control, reliability, and adequate measurement accuracy.
Starting from an extensive survey of the state of the art and from a clear and concise overview of the theoretical background, throughout the book, the different approaches of BMR are considered (i.e., time domain reflectometry - TDR, frequency domain reflectometry - FDR, and the TDR/FDR combined approach) and several applications are thoroughly investigated.
The applications considered herein are very diverse from each other and cover different fields. In all the described procedures and methods, the ultimate goal is to endow them with a significant performance enhancement in terms of measurement accuracy, low cost, versatility, and practical implementation possibility, so as to unlock the strong potential of BMR.
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Keywords
Table of contents (6 chapters)
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Front Matter
Authors and Affiliations
Bibliographic Information
Book Title: Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications
Authors: Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazza
Series Title: Lecture Notes in Electrical Engineering
DOI: https://doi.org/10.1007/978-3-642-20233-9
Publisher: Springer Berlin, Heidelberg
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Berlin Heidelberg 2011
Hardcover ISBN: 978-3-642-20232-2Published: 27 May 2011
Softcover ISBN: 978-3-642-26797-0Published: 29 May 2013
eBook ISBN: 978-3-642-20233-9Published: 31 March 2011
Series ISSN: 1876-1100
Series E-ISSN: 1876-1119
Edition Number: 1
Number of Pages: XVIII, 150
Topics: Electronics and Microelectronics, Instrumentation, Microwaves, RF and Optical Engineering, Measurement Science and Instrumentation, Optics, Lasers, Photonics, Optical Devices