Abstract
Commonly used approaches for accumulating coverage data do not properly track events that have been covered in the past but not recently (stale events). They either treat stale events as covered events (global approach) or as uncovered events (window approach). We propose a new approach called reverse coverage analysis that is based on tracking the last time each coverage event was hit and looking at the coverage data backward in time from the present. With this approach, we can easily identify stale events and when the ability to cover them was lost. The reverse coverage approach was successfully used in the verification of two high-end IBM microprocessors and improved treatment of stale events and their causes.
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Birnbaum, A., Fournier, L., Mittermaier, S., Ziv, A. (2012). Reverse Coverage Analysis. In: Eder, K., Lourenço, J., Shehory, O. (eds) Hardware and Software: Verification and Testing. HVC 2011. Lecture Notes in Computer Science, vol 7261. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34188-5_17
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DOI: https://doi.org/10.1007/978-3-642-34188-5_17
Publisher Name: Springer, Berlin, Heidelberg
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