Abstract
HIGHT, proposed in CHES 2006, is a block cipher standard approved by Telecommunications Technology Association (TTA) of Korea and ISO/IEC 18033-3. It is designed a lightweight block cipher suitable for restricted hardware environment. In this paper, we propose a differential fault attack on HIGHT with a small number of fault injections. The proposed attack can recover the 128-bit secret key with more than 4 faulty ciphertexts based on a random byte fault model. Our attack has O(232) computational complexity and O(212) memory complexity and is the first known differential fault attack on HIGHT.
This research was partially supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (grant number 2012-0003556) & this research was partially supported by Seoul National University of Science and Technology.
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References
Biham, E., Shamir, A.: Differential Fault Analysis of Secret Key Cryptosystems, Crypto 1997, LNCS 1294, pp. 513–525. Springer, New York (1997)
BlÖmer, J., Seifert, J.P.: Fault Based Cryptanalysis of the Advanced Encryption Standard (AES), Financial Cryptography 2003. FC 2003, LNCS 2742, pp. 162–181. Springer, New York (2003)
Chen, H., Wu, W., Feng, D.: Differential Fault Analysis on CLEFIA, ICICS 2007, LNCS 4861, pp. 284–295. Springer, New York (2007)
Dusart, P., Letourneux, G., Vivolo, O.: Differential Fault Analysis on AES, ACNS 2003, LNCS 2846, pp. 293–306. Springer, New York (2003)
Giraud, C.: DFA on AES, 4th International Conference, AES 2004, LNCS 3373, pp. 27–41. Springer, New York (2005)
Hemme, L.: A Differential Fault Analysis Against Early Rounds of (Triple-) DES, CHES 2004, LNCS 3156, pp. 254–267. Springer, New York (2006)
Hong, D., Sung, J., Hong, S., Lim, J., Lee, S., Koo, B.S., Lee, C., Chang, D., Lee, J., Jeong, K., Kim, H., Kim, J., Chee, S.: HIGHT: A New Block Cipher Suitable for Low-Resource Device, CHES 2006, LNCS 4249, pp. 46–59. Springer, New York (2006)
International Organization for Standardization, ISO/IEC 18033-3:2005. Information Technology—Security Techniques—Encryption Algorithms—Part 3: Block ciphers (2005)
Jeong, K., Lee, Y., Sung, J., Hong, S.: Differential Fault Analysis on Block Cipher SEED. Elsevier, Kidlington (2011)
Koo, B., Hong, D., Kwon, D.: Related-Key Attack on the Full HIGHT, ICISC 2010. LNCS 6829, pp. 49–67. Springer, New York (2011)
Li, W., Gu, D., Li, J.: Differential Fault Analysis on the ARIA Algorithm, Information Sciences, vol. 178, no. 19, pp. 3727–3737. Elsevier, Kidlington (2008)
Li, W., Gu, D., Wang, Y.: Dierential fault analysis on the contracting UFN structure, with application to SMS4 and Macguffin. J. Syst. Softw. 82(2), 346–354 (2009)
Lu, J.: Cryptanalysis of Reduced Versions of the HIGHT Block Cipher from CHES 2006, ICISC 2007. LNCS 4817, pp. 11–26. Springer, New York (2007)
Mukhopadhyay, D.: An Improved Fault Based Attack of the Advanced Encryption Standard, AFRICACRYPT 2009, LNCS 5580, pp. 421–434. Springer, New York (2009)
Özen, O., Varıcı, K., Tezcan, C., Kocair, C.: Lightweight Block Ciphers Revisited: Cryptanalysis of Reduced Round PRESENT and HIGHT, ACISP 2009. LNCS 5594, pp. 90–107. Springer, New York (2009)
Zhang, P., Sun, B., Li, C.: Saturation Attack on the Block Cipher HIGHT, CANS 2009. LNCS 5888, pp. 76–86. Springer, New York (2009)
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Lee, Y., Kim, J., Park, J.H., Hong, S. (2012). Differential Fault Analysis on the Block Cipher HIGHT. In: J. (Jong Hyuk) Park, J., Leung, V., Wang, CL., Shon, T. (eds) Future Information Technology, Application, and Service. Lecture Notes in Electrical Engineering, vol 164. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-4516-2_41
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DOI: https://doi.org/10.1007/978-94-007-4516-2_41
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