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DELPHI-EXPERT an expert system for error diagnosis in High Energy Physics detectors

  • Knowledge-Based Systems II
  • Conference paper
  • First Online:
Industrial and Engineering Applications of Artificial Intelligence and Expert Systems (IEA/AIE 1992)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 604))

Abstract

An expert system for error diagnosis in a large and very complex High Energy Physics experiment has been developed. The system is installed in the experimental environment and has been tested under real experimental conditions during last year's data taking period. From may '92 onwards, the system will cooperate with the experiment's shift crew. We will report on the system's philosophy, the way of inferring symptoms and possible malfunctions, as well as on first experiences on running DELPHI-EXPERT within the data acquisition system of the experiment.

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References

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Author information

Authors and Affiliations

  1. Department of Physics, University of Wuppertal, Wuppertal

    K. -H. Becks, A. Hemker & J. Ortmann

  2. Department of Informatics, University of Bonn, Bonn

    A. B. Cremers

  3. Department of Informatics, University of Hagen, Hagen

    R. Meyer & G. Schlageter

Authors
  1. K. -H. Becks
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  2. A. B. Cremers
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  3. A. Hemker
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  4. R. Meyer
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  5. J. Ortmann
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  6. G. Schlageter
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Editor information

Fevzi Belli Franz Josef Radermacher

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© 1992 Springer-Verlag Berlin Heidelberg

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Becks, K.H., Cremers, A.B., Hemker, A., Meyer, R., Ortmann, J., Schlageter, G. (1992). DELPHI-EXPERT an expert system for error diagnosis in High Energy Physics detectors. In: Belli, F., Radermacher, F.J. (eds) Industrial and Engineering Applications of Artificial Intelligence and Expert Systems. IEA/AIE 1992. Lecture Notes in Computer Science, vol 604. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0025013

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  • DOI: https://doi.org/10.1007/BFb0025013

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-55601-5

  • Online ISBN: 978-3-540-47251-3

  • eBook Packages: Springer Book Archive

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