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Few-shot classification with intra-class co-salient learning and holistic metric

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Abstract

Few-shot learning is to learn to discriminate novel classes from a minimal amount of support images. The core of the matter lies in obtaining effective feature representations from limited samples and measuring the similarity between query and support images. In this paper, we approach this problem from two perspectives: effective feature learning and similarity measurement. We observe that the objects being classified are typically the common salient targets within the support class in few-shot classification. Based on this observation, we design a Co-Salient Feature Extraction module which can learn the correlations among the intra-class samples in the support images, thereby making the learned features more representative of the class. Regarding similarity measurement, we comprehensively consider both the global features and local details of the images and propose a Multi-Scale Metric module to implement holistic metric and improve the reliability of image-to-class measurement. We conduct experiments on four benchmark datasets for few-shot image classification, including general object recognition, fine-grained categorization, and cross-domain classification. The experimental results in various few-shot learning scenarios demonstrate that the proposed Intra-class Co-Salient (ICoS) network achieves competitive performance, particularly excelling in fine-grained classification, ICoS outperforms the similarity techniques DN4 by 20.61% in 1-shot and 11.23% in 5-shot on the CUB dataset, demonstrating the validity of co-salient learning.

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Data availability

Datasets generated during the current study are available from the corresponding author on reasonable request.

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Acknowledgements

This work was supported by the Natural Science Foundation of Hunan Province, China, under Grants 2022JJ30746.

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Correspondence to Ruyi Zhu.

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Chen, B., Zhu, R., Yu, L. et al. Few-shot classification with intra-class co-salient learning and holistic metric. Neural Comput & Applic 36, 14327–14339 (2024). https://doi.org/10.1007/s00521-024-09866-w

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