Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
Skip to main content

An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

The challenging tolerance problem in fault diagnosis of analog circuit remains unsolved. To diagnose the soft-fault with tolerance effectively, a novel diagnosis approach based on the ratio of normal variables and the slope fault model was proposed. Firstly, the approximate distribution function of the ratio of normal variables was deduced and the basic approximate conditions were given to improve the approximation accuracy. The conditional monotonous and continuous mapping between the ratio of normal variables and the standard normal variable was proved. Based on the aforementioned proved mapping, the estimation formulas of the range of the ratio of normal variables were deduced. Then, the principle of the slope fault model for linear analog circuit was presented. After the contrastive analysis of the typical methods of handling tolerance based on the slope fault model, the ratio of normal variables and the slope fault model were combined and a test-nodes selection algorithm based on the basic approximate conditions of ratio of normal variables was designed, by which the computation can be reduced greatly. Finally, experiments were done to illustrate the proposed approach and demonstrate its effectiveness.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4

Similar content being viewed by others

References

  1. Bandler JW, Salama AE (1985) Fault diagnosis of analog circuits. Proc IEEE 73(8):1279–1325

    Article  Google Scholar 

  2. Bing L, Shulin T, Houjun W (2012) Feature vector selection method using Mahalanobis distance for diagnostics of analog circuits based on LS-SVM. J Electron Test:1–11

  3. Catelani M, Fort A (2002) Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks. IEEE Trans Instrum Meas 51(2):196–202

    Article  Google Scholar 

  4. Chaojie Z, Guo H, Shuhai L (2008) Test point selection of analog circuits based on fuzzy theory and ant colony algorithm. IEEE Autotestcon:164–168

  5. Chung KL (2001) A Course in Probability Theory, 3rd edn. Elsevier Inc, America

    Google Scholar 

  6. El-Gamala MA, Abdulghafour M (2003) Fault isolation in analog circuits using a fuzzy inference system. Elsevier Comput Electr Eng 29:213–229

    Google Scholar 

  7. Hayt WH Jr, Kemmerly JE, Durbin SM (2007) Engineering circuit analysis, 7th edn. McGraw-Hill Companies, America

    Google Scholar 

  8. Hinkley DV (1969) On the ratio of two correlated normal random variables. Biometrika 56(3):635–639

    Article  MathSciNet  MATH  Google Scholar 

  9. Hochwald W, Bastian JD (1979) A dc approach for analog fault dictionary determination. IEEE Trans Circ Syst CAS-26:523–529

    Article  Google Scholar 

  10. Huang K, Stratigopoulos H-G, Mir S (2010) Fault diagnosis of analog circuits based on machine learning. In: Proceedings of design automation and test in Europe conference (DATE), pp 1761–1766

  11. Huang K, Stratigopoulos H-G, Mir S, Hora C, Xing Y, Kruseman B (2012) Diagnosis of local spot defects in analog circuits. IEEE Trans Instrum Meas (TIM) 61(10):2701–2712

    Article  Google Scholar 

  12. Kaminska B, Arabi K, Bell I, Goteti P (1997) Analog and mixed-signal benchmark circuits - first release. IEEE Int Test Conf. Washington:183–190

  13. Li F, Woo PY (1999) The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method. IEEE Trans Circ Systems I: Fundam Theory Appl 46(10):1222–1227

    Article  Google Scholar 

  14. Lin PM, Elcherif YS (1985) Analogue circuits fault dictionary new approaches and implementation. Int J Circuit Theory Appl 13(2):149–172

    Article  Google Scholar 

  15. Marsaglia G. (1997) Ratios of normal varialbles and ratios of sums of uniform variables. J Am Stat Assoc 60(309):193–204

    Article  MathSciNet  Google Scholar 

  16. Peng W, Shiyuan Y (2006) A soft fault dictionary method for analog circuit diagnosis based on slope fault model. Microcomput Inf (Control Autom) 22(11–1):1–2, 23. (in Chinese)

    Google Scholar 

  17. Peng W, Shiyuan Y (2007) Circuit tests based on the linear relationships between changes in node voltages. J Tsinghua Univ (Sci Tech) 47(7):1245–1248. (in Chinese)

    Google Scholar 

  18. Slamani M, Kaminska B (1992) Analog circuit fault diagnosis based on sensitivity computation and functional testing. IEEE Des Test Comput 9(1):30–39

    Article  Google Scholar 

  19. Starzyk JA, Pang J, Manetti S (2000) Finding ambiguity groups in low testability analog circuits. IEEE Trans Circ and Systems I: Fundam Theory and Appl 47(8):1125–1137

    Article  MathSciNet  MATH  Google Scholar 

  20. Vock SR, Escalona OJ, Turner C (2012) Challenges for semiconductor test engineering. J Electron Test 28(3):365–374

    Article  Google Scholar 

  21. Wang P, Yang S (2006) A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math. IEEE Trans Circ Systems Regular Paper 52(10):2118–2127

    Article  Google Scholar 

  22. Wei Z, Aiqiang X, Zhenlin C (2006) Fault dictionary method in analog circuits based on node voltage sensitivity weight sequence. J Electron Meas Instrum 20:46–49. (in Chinese)

    Google Scholar 

  23. Yang C, Tian S, Long B (2011) Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Trans Instrum Meas 60(1):176–185

    Article  Google Scholar 

  24. Zhou L, Shi Y, Tang J (2009) Soft fault diagnosis in analog circuit based on fuzzy and direction vector. Metrol Meas Syst 16(1):61–75

    Google Scholar 

  25. Zhang W, Zhou L, Shi Y (2010) Soft-fault diagnosis of analog circuit with tolerance using FNLP. Metrol Meas Syst XVII(3):349–362

    Article  Google Scholar 

Download references

Acknowledgments

This work was supported by National Natural Science Foundation of China (No. 61201131) and the Fundamental Research Funds for the Central Universities of China (No. ZYGX2012J092, No. ZYGX2012J094). The authors would like to thank all anonymous reviewers valuable comments on this paper.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Yongcai Ao.

Additional information

Responsible Editor: H. Stratigopoulos

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ao, Y., Shi, Y., Zhang, W. et al. An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis. J Electron Test 29, 555–565 (2013). https://doi.org/10.1007/s10836-013-5382-z

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-013-5382-z

Keywords