Abstract
Recently, system-on-chips (SoCs) are increasingly employed in reliable applications for their high-performance and high-densities. Moreover, the structure shrinking of SoC leads to its proneness to radiation-induced soft errors. This paper presents a fine-grained fault injection framework for SoC (FFI4SoC) to assess the reliability of SoC against soft errors. FFI4SoC facilitates fault injection for SoC by defining the primary components and rules that are required by fine-grained fault injection. Furthermore, based on FFI4SoC, we develop a fine-grained fault injection tool named SSIFFI for bare-metal MicroZed. The design of SSIFFI is presented in order to illustrate the application of FFI4SoC. Finally, SSIFFI is engaged in simulated fault injection experiments to explore the cause of single event functional interrupts (SEFIs) and to validate functional properties of FFI4SoC. The experimental results disclose detailed reasons for SEFI and prove that FFI4SoC can be employed to assess reliability of SoC well with the merit of fine-grained injection.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Arlat J, Aguera M, Amat L, Crouzet Y, Fabre JC, Laprie JC, Martins E, Powell D (1990) Fault injection for dependability validation: a methodology and some applications. IEEE Trans Softw Eng 16:166–182
ARM Limited (2014) ARM architecture reference manual, in https://silver.arm.com/download/ARM_and_AMBA_Architecture/AR570-DA-70000-r0p0-00rel2/DDI0406C_C_arm_architecture_reference_manual.pdf
Carreira J, Madeira H, Silva JG (1998) Xception: a technique for the experimental evaluation of dependability in modern computers. IEEE Trans Softw Eng 24:125–136
Döbel B (2014) Operating system support for redundant multithreading. PhD dissertation, Technischen Universität Dresden
Du X, He C, Liu S, Zhang Y, Li Y, Xiong C, Tan P (2016) Soft error evaluation and vulnerability analysis in Xilinx Zynq-7010 system-on chip. Nucl Instruments Methods Phys Res Sect A Accel Spectrometers, Detect Assoc Equip 831:344–348
Du X, Liu S, Luo D, Zhang Y, Du X, He C, Ren X, Yang W, Yuan Y (2017) Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip. Microelectron Reliab 71:65–70
Faure F, Velazco R, Peronnard P (2005) Single-event-upset-like fault injection: a comprehensive framework. IEEE Trans Nucl Sci 52:2205–2209
Giuffrida C, Kuijsten A, Tanenbaum AS (2013) EDFI: a dependable fault injection tool for dependability benchmarking experiments. In: Proceedings of IEEE PRDC
Hsueh M-C, Tsai TK, Iyer RK (1997) Fault injection techniques and tools. Comput 30:75–82
Kanawati GA, Kanawati NA, Abraham JA (1995) FERRARI: a flexible software-based fault and error injection system. IEEE Trans Comput 44:248–260
Kapritsos M, Wang Y, Quema V, Clement A, Alvisi L, Dahlin M (2012) All about eve: execute-verify replication for multi-core servers. In: Proceedings of OSDI
Le M, Tamir Y (2015) Fault injection in virtualized systems - challenges and applications. IEEE Trans Dependable Secure Comput 12:284–297
Li D, Chen Z, Wu P, Vetter JS (2013) Rethinking algorithm-based fault tolerance with a cooperative software-hardware approach. In: Proceedings of ACM International Conference on High Performance Computing, Networking, Storage and Analysis
Lu Q, Farahani M, Wei J, Thomas A, Pattabiraman K (2015) LLFI: an intermediate code-level fault injection tool for hardware faults. In: Proceedings of IEEE QRS
Naughton T, Bland W, Vallée G, Engelmann C, Scott SL (2009) Fault injection framework for system resilience evaluation. In: Proceedings of ACM Workshop on Resiliency High Performance
Reis GA, Chang J, Vachharajani N, August DI (2005) Design and evaluation of hybrid fault-detection systems. In: Proceedings of IEEE ISCA
Reis GA, Chang J, Vachharajani N, Rangan R, August DI (2005) SWIFT: software implemented fault tolerance. In: Proceedings of IEEE International Symposium on Code Generation and Optimization
Schiffel U, Schmitt A, Süßkraut M, Fetzer C (2010) ANB-and ANBDmem-encoding: detecting hardware errors in software. Comput Safety Reliab Secur 169–182
Schirmeier H, Hoffmann M, Dietrich C, Lenz M, Lohmann D, Spinczyk O (2016) FAIL∗: an open and versatile fault-injection framework for the assessment of software-implemented hardware fault tolerance. In: Proceedings of IEEE EDCC
Shekhar B (2005) Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE Micro 25:10–16
Souari A, Thibeault C, Blaquiere Y, Velazco R (2015) Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis. In: Proceedings of IEEE IOLTS
Tröger P, Salfner F, Tschirpke S (2010) Software-implemented fault injection at firmware level. In: Proceedings of IEEE DEPEND
United States Department of Defense (1998) Electronic reliability design handbook, MIL-HDBK-338B
United States Nuclear Regulatory Commission (1993) Fault tree handbook, NUREG-0492
Vargas V, Ramos P, Velazco R, Mehaut JF, Zergainoh NE (2015) Evaluating SEU fault-injection on parallel applications implemented on multicore processors. In Proceedings of IEEE LASCAS
Velasco AD, Montrucchio B, Rebaudengo M (2015) KITO tool: a fault injection environment in Linux kernel data structures. Microelectron Reliab 60:153–162
Velazco R, Mansour W, Pancher F, Marques-Costa G, Sohier D, Bui A (2012) Improving SEU fault tolerance capabilities of a self-converging algorithm. IEEE Trans Nucl Sci 59:818–823
Xilinx Inc (2013) Zynq-7000 all programmable SoC overview, DS190 (v1.6), in http://www.xilinx.com/support/documentation/data_sheets/ds190-Zynq-7000-Overview.pdf
Acknowledgments
This work was supported by the Chinese National Natural Science Foundation (grant number 11575138), the Industrial PR project of Shaanxi Province (grant number 2013 K06-20) and the Fundamental Research Funds for the Central Universities in China (grant number XJJ2015122).
Author information
Authors and Affiliations
Corresponding author
Additional information
Responsible Editor: M. Renovell
Rights and permissions
About this article
Cite this article
Du, X., Luo, D., Shi, K. et al. FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. J Electron Test 34, 15–25 (2018). https://doi.org/10.1007/s10836-017-5702-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-017-5702-9